cam a22 4 4500 128591099 CHVBK 20200921121516.0 880212s1976 xxk 10 eng|d (OCoLC)636999190 (NEBIS)000206568 SzZuIDS NEBIS ETH-BIB Scanning electron microscopy application and techniqes ed.: I.F. Ferguson : UKAEA Diffraction Analysis Conference, 24th meeting, Windscale, 6-7 October 1976 Warrington The Reactor Group, UKAEA 1976 31 p. pl. TRG report 2989 2989 (NEBIS)000021978 126385122 RASTERELEKTRONENMIKROSKOPE, REM + RASTERELEKTRONENMIKROSKOPIE ger (ETHUDK)000028722 ethudk Konferenzschrift Seascale 1976 gnd-content u RASTERELEKTRONENMIKROSKOPE, REM + RASTERELEKTRONENMIKROSKOPIE ger 621.385.833.28 nebis E1 u SCANNING ELECTRON MICROSCOPES, SEM + SCANNING ELECTRON MICROSCOPY eng 621.385.833.28 nebis E1 u MICROSCOPES ÉLECTRONIQUES À BALAYAGE + MICROSCOPIE ÉLECTRONIQUE À BALAYAGE fre 621.385.833.28 nebis E1 Ferguson J.F. Ukaea Diffraction Analysis Conference (DE-588)109187378X BK020800 XK020000 XK020000 Seascale Kongress = Congrès 1976 NEBIS E16 E16 RH REP GB 37: 2989 NEBIS 490 -- TRG report 2989 2989 (NEBIS)000021978 126385122 NEBIS 700 1- Ferguson J.F. NEBIS 711 2- Ukaea Diffraction Analysis Conference (DE-588)109187378X