cam a22 u 4500 128738243 CHVBK 20200921121822.0 880212s1981 xxu | 10 |eng|d (OCoLC)637166463 (NEBIS)000249595 ETH-BIB ger ETH-BIB ETHICS-ISBD Testing in the 1980's conference, (Philadelphia - Pa.), October 27-29, 1981; digest of papers spons.: IEEE computer Society; Test technology Committee & Philadelphia Section of the IEEE Los Angeles 1981 XXIV, 568 p. fig.; diagr.; tab. International test conferenc [12] 12 (NEBIS)000016930 126551731 ELEKTRONIK ger (ETHUDK)000028643 ethudk QUALITÄTSÜBERWACHUNG (UNTERNEHMENSFÜHRUNG) ger (ETHUDK)000032600 ethudk Konferenzschrift Philadelphia (PA) 1981/10 gnd-content u ELEKTRONIK ger 621.38 nebis E1 u QUALITÄTSÜBERWACHUNG (UNTERNEHMENSFÜHRUNG) ger 65,02.04.041.1 nebis E1 u ÉLECTRONIQUE fre 621.38 nebis E1 u ELECTRONICS eng 621.38 nebis E1 u SURVEILLANCE DE LA QUALITÉ (GESTION D'ENTREPRISE) fre 65,02.04.041.1 nebis E1 u QUALITY SUPERVISION (BUSINESS MANAGEMENT) eng 65,02.04.041.1 nebis E1 BK020800 XK020000 XK020000 Philadelphia (PA) Kongress = Congrès 1981/10 NEBIS E16 E16 RH P 300962: 12 NEBIS 490 -- International test conferenc [12] 12 (NEBIS)000016930 126551731