1998 IEEE International Integrated Reliability Workshop, final report

Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998

Verfasser / Beitragende:
spons. by the IEEE Electron Devices Society ... [et al.]
Ort, Verlag, Jahr:
Piscataway, NJ : IEEE, 1998
Beschreibung:
VI, 140 S. : Ill. ; 28 cm
Format:
Buch (Kongress)
ID: 143954342