Time and frequency metrology III

24-25 August 2011, San Diego, California, United States

Verfasser / Beitragende:
Tetsuya Ido, Thomas R. Schibli (eds.) ; spons. and publ. by SPIE - The International Society for Optical Engineering
Ort, Verlag, Jahr:
Bellingham, Washington : SPIE, 2011
Beschreibung:
1 Band : Ill.
Format:
Buch (Kongress)
ID: 179534114