Reliability and materials issues of III-V and II-VI semiconductor optical and electron devices and materials II

symposium held April 9-13, 2012, San Francisco, California, U.S.A

Verfasser / Beitragende:
eds., Osamu Ueda ... [et al.]
Ort, Verlag, Jahr:
Warrendale, Pa. : Materials Research Society, 2012
Beschreibung:
195 S. : Ill.
Format:
Buch (Kongress)
ID: 18345085X