Ion implantation and backscattering from oxidized single-crystal copper

Verfasser / Beitragende:
J. Rickards and G. Dearnaley
Ort, Verlag, Jahr:
1973
Enthalten in:
Applications of ion beams to metals : [International Conference on Applications of Ion Beams to Metals, Albuquerque, 1973], 101
Format:
Artikel
ID: 224271784