Semiconductor reliability

based on the Conference on Reliability of Semiconductor Devices, 1961, sponsored by the Working Group on Semiconductor Devices, Advisory Group on Electron Tubes, Department of Defense

Verfasser / Beitragende:
ed. by John E. Shwop, Harold J. Sullivan
Ort, Verlag, Jahr:
Elizabeth, N.J. : Engineering Publ., 1961
Beschreibung:
IX, 309 p. : ill. ; 24 cm
Format:
Buch (Kongress)
ID: 24494587X