cam a22 4 4500 316954780 CHVBK 20201017071130.0 cr ||||||||||| 140227s2013 xxu s 10 eng 978-1-4673-5682-4 1-4673-5681-6 (OCoLC)891520423 (NEBIS)010165387 SzZuIDS NEBIS ETH-BIB 2013 IEEE AUTOTESTCON Schaumburg, Illinois, USA, 16-19 September 2013 Piscataway, NJ IEEE 2013 Online-Ressource Text txt rdacontent/ger Computermedien c rdamedia/ger Online-Ressource cr rdacarrier/ger DEFEKTERKENNUNG + FEHLERERKENNUNG (ELEKTROTECHNIK) ger (ETHUDK)000049102 ethudk TESTEN + FEHLERSUCHEN (SOFTWARE ENGINEERING) ger (ETHUDK)000013747 ethudk Konferenzschrift Schaumburg (IL) 2013 gnd-content u DEFEKTERKENNUNG + FEHLERERKENNUNG (ELEKTROTECHNIK) ger 621.3,3.004.64 nebis E1 u TESTEN + FEHLERSUCHEN (SOFTWARE ENGINEERING) ger 004*04*04*06 nebis E1 u DEFECT RECOGNITION + FAULT RECOGNITION (ELECTRICAL ENGINEERING) eng 621.3,3.004.64 nebis E1 u DÉPANNAGE + RECHERCHE DE PANNES + DÉPISTAGE DES DÉFAUTS (ÉLECTROTECHNIQUE) fre 621.3,3.004.64 nebis E1 u TESTING + DEBUGGING (SOFTWARE ENGINEERING) eng 004*04*04*06 nebis E1 u TESTS ET MISE AU POINT DE PROGRAMMES fre 004*04*04*06 nebis E1 Institute of Electrical and Electronics Engineers (DE-588)1692-5 IEEE International Automatic Testing Conference (DE-588)1091861765 http://sfx.ethz.ch/sfx_locater?sid=ALEPH:EBI01&genre=book&isbn=1-4673-5681-6 Online via SFX Volltext BK020853 XK020053 XK020000 EText nebis ED E01-Manuell nebis ER noalma ids I 050 E01-20140818 094 E01-20140818 Schaumburg (IL) Kongress = Congrès 2013 NEBIS E01 E01 EL NEBIS 710 2- Institute of Electrical and Electronics Engineers (DE-588)1692-5 NEBIS 711 2- IEEE International Automatic Testing Conference (DE-588)1091861765 NEBIS 856 -- http://sfx.ethz.ch/sfx_locater?sid=ALEPH:EBI01&genre=book&isbn=1-4673-5681-6 Online via SFX Volltext SWISSBIB 316953369