The influence of channelling on radiation damage produced in silicon during ion bombardment
Gespeichert in:
Verfasser / Beitragende:
R.S. Nelson, D.J. Mazey
Ort, Verlag, Jahr:
Harwell, Berkshire :
UK Atomic Energy Authority Research Group,
1967
Beschreibung:
6 S. : Ill.
Format:
Buch