Wavelet Bayesian Method for Denoising of Nano-Scalar Surface Measurement
| LEADER | caa a22 4500 | ||
|---|---|---|---|
| 001 | 378851667 | ||
| 003 | CHVBK | ||
| 005 | 20180305123324.0 | ||
| 007 | cr unu---uuuuu | ||
| 008 | 161128e200306 xx s 000 0 eng | ||
| 024 | 7 | 0 | |a 10.1515/IJMSP.2003.5.1-2.95 |2 doi |
| 035 | |a (NATIONALLICENCE)gruyter-10.1515/IJMSP.2003.5.1-2.95 | ||
| 245 | 0 | 0 | |a Wavelet Bayesian Method for Denoising of Nano-Scalar Surface Measurement |h [Elektronische Daten] |c [S. J. Xiao,, X.Q. Jiang,, L. Blunt,] |
| 540 | |a ©2011 by Walter de Gruyter GmbH & Co. | ||
| 700 | 1 | |a Xiao, |D S. J. |4 aut | |
| 700 | 1 | |a Jiang, |D X.Q. |4 aut | |
| 700 | 1 | |a Blunt, |D L. |4 aut | |
| 773 | 0 | |t Journal for Manufacturing Science and Production |d De Gruyter |g 5/1-2(2003-06), 95-98 |x 0793-6648 |q 5:1-2<95 |1 2003 |2 5 |o IJMSP | |
| 856 | 4 | 0 | |u https://doi.org/10.1515/IJMSP.2003.5.1-2.95 |q text/html |z Onlinezugriff via DOI |
| 908 | |D 1 |a research article |2 jats | ||
| 950 | |B NATIONALLICENCE |P 856 |E 40 |u https://doi.org/10.1515/IJMSP.2003.5.1-2.95 |q text/html |z Onlinezugriff via DOI | ||
| 950 | |B NATIONALLICENCE |P 700 |E 1- |a Xiao |D S. J. |4 aut | ||
| 950 | |B NATIONALLICENCE |P 700 |E 1- |a Jiang |D X.Q. |4 aut | ||
| 950 | |B NATIONALLICENCE |P 700 |E 1- |a Blunt |D L. |4 aut | ||
| 950 | |B NATIONALLICENCE |P 773 |E 0- |t Journal for Manufacturing Science and Production |d De Gruyter |g 5/1-2(2003-06), 95-98 |x 0793-6648 |q 5:1-2<95 |1 2003 |2 5 |o IJMSP | ||
| 900 | 7 | |b CC0 |u http://creativecommons.org/publicdomain/zero/1.0 |2 nationallicence | |
| 898 | |a BK010053 |b XK010053 |c XK010000 | ||
| 949 | |B NATIONALLICENCE |F NATIONALLICENCE |b NL-gruyter | ||