Renewed interest in powder diffraction data indexing

Verfasser / Beitragende:
[Jörg Bergmann, Armel Le Bail, Robin Shirley, Victor Zlokazov]
Ort, Verlag, Jahr:
2004
Enthalten in:
Zeitschrift für Kristallographie - Crystalline Materials, 219/12(2004-12-01), 783-790
Format:
Artikel (online)
ID: 37891247X
LEADER caa a22 4500
001 37891247X
003 CHVBK
005 20180305123545.0
007 cr unu---uuuuu
008 161128e20041201xx s 000 0 eng
024 7 0 |a 10.1524/zkri.219.12.783.55862  |2 doi 
035 |a (NATIONALLICENCE)gruyter-10.1524/zkri.219.12.783.55862 
245 0 0 |a Renewed interest in powder diffraction data indexing  |h [Elektronische Daten]  |c [Jörg Bergmann, Armel Le Bail, Robin Shirley, Victor Zlokazov] 
520 3 |a Recently released powder indexing programs are reviewed and placed in competition with the established programs (ITO, TREOR, DICVOL, etc.) through a series of problems selected among previously unindexed ICDD entries designated as "high quality”. Benchmarks are provided for testing indexing programs, based on the bethanechol chloride powder diffraction data. Applying these benchmarks leads to a classification (with respect to this specific example) of indexing programs as they face progressively more difficult situations. High data quality and the user experience to obtain it are concluded to remain the best way to indexing success, given that nearly all programs produce excellent results with excellent data. Lack of attention to data quality, even if followed by use of the most efficient programs, will usually lead to failure. It is demonstrated how not restricting oneself to a single indexing program can considerably increase the chances of success. 
540 |a © 2004 Oldenbourg Wissenschaftsverlag GmbH 
690 7 |a Crystallography  |2 nationallicence 
690 7 |a Inorganic chemistry  |2 nationallicence 
690 7 |a Organic chemistry  |2 nationallicence 
700 1 |a Bergmann  |D Jörg  |4 aut 
700 1 |a Le Bail  |D Armel  |4 aut 
700 1 |a Shirley  |D Robin  |4 aut 
700 1 |a Zlokazov  |D Victor  |4 aut 
773 0 |t Zeitschrift für Kristallographie - Crystalline Materials  |d De Gruyter Oldenbourg  |g 219/12(2004-12-01), 783-790  |x 2194-4946  |q 219:12<783  |1 2004  |2 219  |o zkri 
856 4 0 |u https://doi.org/10.1524/zkri.219.12.783.55862  |q text/html  |z Onlinezugriff via DOI 
908 |D 1  |a research article  |2 jats 
950 |B NATIONALLICENCE  |P 856  |E 40  |u https://doi.org/10.1524/zkri.219.12.783.55862  |q text/html  |z Onlinezugriff via DOI 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Bergmann  |D Jörg  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Le Bail  |D Armel  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Shirley  |D Robin  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Zlokazov  |D Victor  |4 aut 
950 |B NATIONALLICENCE  |P 773  |E 0-  |t Zeitschrift für Kristallographie - Crystalline Materials  |d De Gruyter Oldenbourg  |g 219/12(2004-12-01), 783-790  |x 2194-4946  |q 219:12<783  |1 2004  |2 219  |o zkri 
900 7 |b CC0  |u http://creativecommons.org/publicdomain/zero/1.0  |2 nationallicence 
898 |a BK010053  |b XK010053  |c XK010000 
949 |B NATIONALLICENCE  |F NATIONALLICENCE  |b NL-gruyter