caa a22 4500 378912518 CHVBK 20180305123545.0 cr unu---uuuuu 161128e20041201xx s 000 0 eng 10.1524/zkri.219.12.803.55861 doi (NATIONALLICENCE)gruyter-10.1524/zkri.219.12.803.55861 Exploiting texture to estimate the relative intensities of overlapping reflections [Elektronische Daten] [Christian Baerlocher, Lynne B. McCusker, Sinisa Prokic, Thomas Wessels] Additional information about the relative intensities of reflections that overlap in a powder diffraction pattern can be obtained from a polycrystalline sample in which the crystallites are preferentially oriented. If the data are collected and analyzed appropriately, more single-crystal-like reflection intensities can be extracted, and thereby more complex structures solved. This ‘texture method' was implemented initially in reflection mode and its power demonstrated with the solution of the 117-atom structure of the high-silica zeolite UTD-1F. However, the experiment required a minimum of 3 days of synchrotron beamtime per sample. In an attempt to reduce the amount of beamtime needed and to simplify the experiment itself, a transmission mode alternative using an area detector was developed. Details of the sample preparation, data collection and data analysis for both geometries are described. The solution of the structures of the aluminophosphates Mu-9 (R3̅c, a = 14.0696(1) Å, c = 42.3113(4) Å) and AlPO-M (Pbca, a = 9.7493(1) Å, b = 29.1668(2) Å, c = 9.3528(1) Å) using reflection and transmission mode data, respectively, are provided as examples of the method. © 2004 Oldenbourg Wissenschaftsverlag GmbH Crystallography nationallicence Inorganic chemistry nationallicence Organic chemistry nationallicence Baerlocher Christian aut McCusker Lynne B. aut Prokic Sinisa aut Wessels Thomas aut Zeitschrift für Kristallographie - Crystalline Materials De Gruyter Oldenbourg 219/12(2004-12-01), 803-812 2194-4946 219:12<803 2004 219 zkri https://doi.org/10.1524/zkri.219.12.803.55861 text/html Onlinezugriff via DOI 1 research article jats NATIONALLICENCE 856 40 https://doi.org/10.1524/zkri.219.12.803.55861 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Baerlocher Christian aut NATIONALLICENCE 700 1- McCusker Lynne B. aut NATIONALLICENCE 700 1- Prokic Sinisa aut NATIONALLICENCE 700 1- Wessels Thomas aut NATIONALLICENCE 773 0- Zeitschrift für Kristallographie - Crystalline Materials De Gruyter Oldenbourg 219/12(2004-12-01), 803-812 2194-4946 219:12<803 2004 219 zkri CC0 http://creativecommons.org/publicdomain/zero/1.0 nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-gruyter