Shadowing and absorption corrections of single-crystal high-pressure data

Verfasser / Beitragende:
[Andrzej Katrusiak]
Ort, Verlag, Jahr:
2004
Enthalten in:
Zeitschrift für Kristallographie - Crystalline Materials, 219/8(2004-08-01), 461-467
Format:
Artikel (online)
ID: 378915770
LEADER caa a22 4500
001 378915770
003 CHVBK
005 20180305123552.0
007 cr unu---uuuuu
008 161128e20040801xx s 000 0 eng
024 7 0 |a 10.1524/zkri.219.8.461.38328  |2 doi 
035 |a (NATIONALLICENCE)gruyter-10.1524/zkri.219.8.461.38328 
100 1 |a Katrusiak  |D Andrzej 
245 1 0 |a Shadowing and absorption corrections of single-crystal high-pressure data  |h [Elektronische Daten]  |c [Andrzej Katrusiak] 
520 3 |a The effect of shadowing the sample crystal enclosed in the diamond-anvil high-pressure cell (DAC) by the gasket edges, i.e. by the walls of the high-pressure chamber, has been described for unrestricted data-collection procedures. A general vector formalism reveals new features of the shadowing and absorption corrections, depending on the primary beam-DAC-reflection configuration. The corrections apply to the data measured with conventional normal-beam-equatorial diffractometers, or with area-detectors. The simple vector approach optimizes computations and affords straightforward corrections of intensities. Feasibility of enhancing the resolution of numerical integration by applying fine grid divisions, has been discussed. 
540 |a © 2004 Oldenbourg Wissenschaftsverlag GmbH 
690 7 |a Crystallography  |2 nationallicence 
690 7 |a Inorganic chemistry  |2 nationallicence 
690 7 |a Organic chemistry  |2 nationallicence 
773 0 |t Zeitschrift für Kristallographie - Crystalline Materials  |d De Gruyter Oldenbourg  |g 219/8(2004-08-01), 461-467  |x 2194-4946  |q 219:8<461  |1 2004  |2 219  |o zkri 
856 4 0 |u https://doi.org/10.1524/zkri.219.8.461.38328  |q text/html  |z Onlinezugriff via DOI 
908 |D 1  |a research article  |2 jats 
950 |B NATIONALLICENCE  |P 856  |E 40  |u https://doi.org/10.1524/zkri.219.8.461.38328  |q text/html  |z Onlinezugriff via DOI 
950 |B NATIONALLICENCE  |P 100  |E 1-  |a Katrusiak  |D Andrzej 
950 |B NATIONALLICENCE  |P 773  |E 0-  |t Zeitschrift für Kristallographie - Crystalline Materials  |d De Gruyter Oldenbourg  |g 219/8(2004-08-01), 461-467  |x 2194-4946  |q 219:8<461  |1 2004  |2 219  |o zkri 
900 7 |b CC0  |u http://creativecommons.org/publicdomain/zero/1.0  |2 nationallicence 
898 |a BK010053  |b XK010053  |c XK010000 
949 |B NATIONALLICENCE  |F NATIONALLICENCE  |b NL-gruyter