Annealing studies of high Ge composition Si/SiGe multilayers

Verfasser / Beitragende:
[Mojmír Meduňa, Jiří Novák, Günther Bauer, Václav Holý, Claudiu Valentin Falub, Soichiro Tsujino, Elisabeth Müller, Detlev Grützmacher, Yves Campidelli, Olivier Kermarrec, Daniel Bensahel]
Ort, Verlag, Jahr:
2004
Enthalten in:
Zeitschrift für Kristallographie - Crystalline Materials, 219/4(2004-04-01), 195-200
Format:
Artikel (online)
ID: 378939564
LEADER caa a22 4500
001 378939564
003 CHVBK
005 20180305123648.0
007 cr unu---uuuuu
008 161128e20040401xx s 000 0 eng
024 7 0 |a 10.1524/zkri.219.4.195.30440  |2 doi 
035 |a (NATIONALLICENCE)gruyter-10.1524/zkri.219.4.195.30440 
245 0 0 |a Annealing studies of high Ge composition Si/SiGe multilayers  |h [Elektronische Daten]  |c [Mojmír Meduňa, Jiří Novák, Günther Bauer, Václav Holý, Claudiu Valentin Falub, Soichiro Tsujino, Elisabeth Müller, Detlev Grützmacher, Yves Campidelli, Olivier Kermarrec, Daniel Bensahel] 
520 3 |a For the design flexibility of SiGe based quantum cascade lasers high Ge composition Si/SiGe (x = 80%) superlattices are important. We present an X-ray small angle scattering and high-resolution X-ray diffraction study on strain compensated Si/Si1-xGex multiple quantum well structures with Ge compositions (x up to 80%), grown on Si0.5Ge0.5 pseudo-substrates. To test the temperature stability of such layers occurring in processing steps, in-situ annealing X-ray reflectivity measurements were performed for temperatures up to 810 °C. From the analysis of the reflectivity data, we obtain the layer thicknesses and the interface roughness of the superlattices during annealing. Using a one dimensional diffusion equation, the Ge diffusion coefficient for these conditions was obtained. Furthermore, the strain status and Ge composition in the superlattice structure and in the SiGe buffer before and after annealing were determined from the symmetrical and asymmetrical reciprocal space maps. 
540 |a © 2004 Oldenbourg Wissenschaftsverlag GmbH 
690 7 |a Crystallography  |2 nationallicence 
690 7 |a Inorganic chemistry  |2 nationallicence 
690 7 |a Organic chemistry  |2 nationallicence 
700 1 |a Meduňa  |D Mojmír  |4 aut 
700 1 |a Novák  |D Jiří  |4 aut 
700 1 |a Bauer  |D Günther  |4 aut 
700 1 |a Holý  |D Václav  |4 aut 
700 1 |a Falub  |D Claudiu Valentin  |4 aut 
700 1 |a Tsujino  |D Soichiro  |4 aut 
700 1 |a Müller  |D Elisabeth  |4 aut 
700 1 |a Grützmacher  |D Detlev  |4 aut 
700 1 |a Campidelli  |D Yves  |4 aut 
700 1 |a Kermarrec  |D Olivier  |4 aut 
700 1 |a Bensahel  |D Daniel  |4 aut 
773 0 |t Zeitschrift für Kristallographie - Crystalline Materials  |d De Gruyter Oldenbourg  |g 219/4(2004-04-01), 195-200  |x 2194-4946  |q 219:4<195  |1 2004  |2 219  |o zkri 
856 4 0 |u https://doi.org/10.1524/zkri.219.4.195.30440  |q text/html  |z Onlinezugriff via DOI 
908 |D 1  |a research article  |2 jats 
950 |B NATIONALLICENCE  |P 856  |E 40  |u https://doi.org/10.1524/zkri.219.4.195.30440  |q text/html  |z Onlinezugriff via DOI 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Meduňa  |D Mojmír  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Novák  |D Jiří  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Bauer  |D Günther  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Holý  |D Václav  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Falub  |D Claudiu Valentin  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Tsujino  |D Soichiro  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Müller  |D Elisabeth  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Grützmacher  |D Detlev  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Campidelli  |D Yves  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Kermarrec  |D Olivier  |4 aut 
950 |B NATIONALLICENCE  |P 700  |E 1-  |a Bensahel  |D Daniel  |4 aut 
950 |B NATIONALLICENCE  |P 773  |E 0-  |t Zeitschrift für Kristallographie - Crystalline Materials  |d De Gruyter Oldenbourg  |g 219/4(2004-04-01), 195-200  |x 2194-4946  |q 219:4<195  |1 2004  |2 219  |o zkri 
900 7 |b CC0  |u http://creativecommons.org/publicdomain/zero/1.0  |2 nationallicence 
898 |a BK010053  |b XK010053  |c XK010000 
949 |B NATIONALLICENCE  |F NATIONALLICENCE  |b NL-gruyter