X-ray reflectivity study of the influence of temperature fluctuations on the density profile of thin liquid films

Verfasser / Beitragende:
[Robert Fendt, Michael Sprung, Christian Gutt, Oliver Hermann Seeck, Metin Tolan]
Ort, Verlag, Jahr:
2004
Enthalten in:
Zeitschrift für Kristallographie - Crystalline Materials, 219/4(2004-04-01), 205-209
Format:
Artikel (online)
ID: 378939580
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024 7 0 |a 10.1524/zkri.219.4.205.30446  |2 doi 
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245 0 0 |a X-ray reflectivity study of the influence of temperature fluctuations on the density profile of thin liquid films  |h [Elektronische Daten]  |c [Robert Fendt, Michael Sprung, Christian Gutt, Oliver Hermann Seeck, Metin Tolan] 
520 3 |a We report on X-ray reflectivity experiments of thin liquid heptane films. The films were examined using X-ray reflectivity and modelled both as a layered system using the Parratt algorithm and using a ´phase guessing´ inversion method. Our results combined with simulations of films of shrinking thickness show that small temperature instabilities during the investigation can cause artifacts in the electron density profile. These can easily be mistaken for density os cillations near the interface as might be expected for liquid molecules near a hard wall. 
540 |a © 2004 Oldenbourg Wissenschaftsverlag GmbH 
690 7 |a Crystallography  |2 nationallicence 
690 7 |a Inorganic chemistry  |2 nationallicence 
690 7 |a Organic chemistry  |2 nationallicence 
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700 1 |a Sprung  |D Michael  |4 aut 
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