Polymeric structures at interfaces: An X-ray scattering study

Verfasser / Beitragende:
[Panteleimon Panagiotou, Estelle Bauer, Simona Loi, Tobias Titz, Edith Maurer, Peter Müller-Buschbaum]
Ort, Verlag, Jahr:
2004
Enthalten in:
Zeitschrift für Kristallographie - Crystalline Materials, 219/4(2004-04-01), 210-217
Format:
Artikel (online)
ID: 378939645
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024 7 0 |a 10.1524/zkri.219.4.210.30444  |2 doi 
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245 0 0 |a Polymeric structures at interfaces: An X-ray scattering study  |h [Elektronische Daten]  |c [Panteleimon Panagiotou, Estelle Bauer, Simona Loi, Tobias Titz, Edith Maurer, Peter Müller-Buschbaum] 
520 3 |a X-ray scattering based on synchrotron radiation enables the detection of polymeric structures at interfaces despite the weak contrast between adjacent polymers build-up from different monomeric units. Variable types of polymeric structures result from typical pattern directing mechanisms, such as dewetting in case of homopolymer films, phase separation in polymer blend films, micro-phase separation in diblock copolymer films and surface enrichment in statistical copolymer films. The pattern directing mechanisms introduce structures ordered perpendicular and parallel to the polymeric surface. Consequently, specular and off-specular X-ray scattering is applied as demonstrated within examples. From scattering the characteristic structures which are not accessible by means of other techniques are determined. Limitations with respect to isolated objects such as holes are discussed. 
540 |a © 2004 Oldenbourg Wissenschaftsverlag GmbH 
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