caa a22 4500 378939645 CHVBK 20180305123649.0 cr unu---uuuuu 161128e20040401xx s 000 0 eng 10.1524/zkri.219.4.210.30444 doi (NATIONALLICENCE)gruyter-10.1524/zkri.219.4.210.30444 Polymeric structures at interfaces: An X-ray scattering study [Elektronische Daten] [Panteleimon Panagiotou, Estelle Bauer, Simona Loi, Tobias Titz, Edith Maurer, Peter Müller-Buschbaum] X-ray scattering based on synchrotron radiation enables the detection of polymeric structures at interfaces despite the weak contrast between adjacent polymers build-up from different monomeric units. Variable types of polymeric structures result from typical pattern directing mechanisms, such as dewetting in case of homopolymer films, phase separation in polymer blend films, micro-phase separation in diblock copolymer films and surface enrichment in statistical copolymer films. The pattern directing mechanisms introduce structures ordered perpendicular and parallel to the polymeric surface. Consequently, specular and off-specular X-ray scattering is applied as demonstrated within examples. From scattering the characteristic structures which are not accessible by means of other techniques are determined. Limitations with respect to isolated objects such as holes are discussed. © 2004 Oldenbourg Wissenschaftsverlag GmbH Crystallography nationallicence Inorganic chemistry nationallicence Organic chemistry nationallicence Panagiotou Panteleimon aut Bauer Estelle aut Loi Simona aut Titz Tobias aut Maurer Edith aut Müller-Buschbaum Peter aut Zeitschrift für Kristallographie - Crystalline Materials De Gruyter Oldenbourg 219/4(2004-04-01), 210-217 2194-4946 219:4<210 2004 219 zkri https://doi.org/10.1524/zkri.219.4.210.30444 text/html Onlinezugriff via DOI 1 research article jats NATIONALLICENCE 856 40 https://doi.org/10.1524/zkri.219.4.210.30444 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Panagiotou Panteleimon aut NATIONALLICENCE 700 1- Bauer Estelle aut NATIONALLICENCE 700 1- Loi Simona aut NATIONALLICENCE 700 1- Titz Tobias aut NATIONALLICENCE 700 1- Maurer Edith aut NATIONALLICENCE 700 1- Müller-Buschbaum Peter aut NATIONALLICENCE 773 0- Zeitschrift für Kristallographie - Crystalline Materials De Gruyter Oldenbourg 219/4(2004-04-01), 210-217 2194-4946 219:4<210 2004 219 zkri CC0 http://creativecommons.org/publicdomain/zero/1.0 nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-gruyter