caa a22 4500 38640139X CHVBK 20180307112200.0 cr unu---uuuuu 161130e198906 xx s 000 0 eng 10.1017/S0885715600016444 doi S0885715600016444 pii (NATIONALLICENCE)cambridge-10.1017/S0885715600016444 X-Ray Diffraction Profile Analysis of Powdered Samples [Elektronische Daten] A quantitative phase analysis often requires advanced numerical studies to determine the appropriate intensity values. In this paper the method of fitting analytical functions to the experimental profile is applied to X-ray powder diffraction patterns obtained with FeK radiation. In the present work, the authors examine some problems connected with numerical studies, especially the function describing the experimental profile. The usefulness of the α2 elimination procedure and the angular dependence FWHM are also examined. Copyright © Cambridge University Press 1989 Stanisz G.J. Institute of Physics, Jagellonian University, Reymonta 4, 30-059 Cracow, Poland Holender J.M. Institute of Physics, Jagellonian University, Reymonta 4, 30-059 Cracow, Poland Sołtys J. Institute of Physics, Jagellonian University, Reymonta 4, 30-059 Cracow, Poland Powder Diffraction Cambridge University Press 4/2(1989-06), 70-73 0885-7156 4:2<70 1989 4 PDJ https://doi.org/10.1017/S0885715600016444 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1017/S0885715600016444 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Stanisz G.J. Institute of Physics, Jagellonian University, Reymonta 4, 30-059 Cracow, Poland NATIONALLICENCE 700 1- Holender J.M. Institute of Physics, Jagellonian University, Reymonta 4, 30-059 Cracow, Poland NATIONALLICENCE 700 1- Sołtys J. Institute of Physics, Jagellonian University, Reymonta 4, 30-059 Cracow, Poland NATIONALLICENCE 773 0- Powder Diffraction Cambridge University Press 4/2(1989-06), 70-73 0885-7156 4:2<70 1989 4 PDJ CC0 http://creativecommons.org/publicdomain/zero/1.0 nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-cambridge