caa a22 4500 388019301 CHVBK 20180307124919.0 cr unu---uuuuu 161130e199810 xx s 000 0 eng 10.1557/JMR.1998.0372 doi S0884291400046082 pii (NATIONALLICENCE)cambridge-10.1557/JMR.1998.0372 Kazmerski Lawrence L. Center for Measurements and Characterization, National Renewable Energy Laboratory, Golden, Colorado 80401 Photovoltaics characterization: A survey of diagnostic measurements [Elektronische Daten] [Lawrence L. Kazmerski] The advancement of the photovoltaic technology is closely linked to the standard evaluation of the product, the diagnosis of problems, the validation of materials and cell properties, and the engineering and documentation of the ensemble of device properties from internal interfaces through power outputs. The focus of this paper is on some of the more common, visible, and important techniques dealing with physical-chemical through electro-optical parameters, which are linked intimately to the performance quality of materials and devices. Two areas, defined by their spatial-resolution qualities, are emphasized: macroscale and microscale measurement technologies. The importance, strengths, and limitations of these techniques are stressed, especially their significance to photovoltaics. Included are several techniques that have been developed specifically to address problems and requirements for photovoltaics. The regime of measurement literally covers arrays through atoms. Copyright © Materials Research Society 1998 Journal of Materials Research Cambridge University Press 13/10(1998-10), 2684-2708 0884-2914 13:10<2684 1998 13 JMR https://doi.org/10.1557/JMR.1998.0372 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1557/JMR.1998.0372 text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Kazmerski Lawrence L. Center for Measurements and Characterization, National Renewable Energy Laboratory, Golden, Colorado 80401 NATIONALLICENCE 773 0- Journal of Materials Research Cambridge University Press 13/10(1998-10), 2684-2708 0884-2914 13:10<2684 1998 13 JMR CC0 http://creativecommons.org/publicdomain/zero/1.0 nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-cambridge