caa a22 4500 388019379 CHVBK 20180307124919.0 cr unu---uuuuu 161130e199810 xx s 000 0 eng 10.1557/JMR.1998.0398 doi S0884291400046331 pii (NATIONALLICENCE)cambridge-10.1557/JMR.1998.0398 A method for crystallographic texture investigations using standard x-ray equipment [Elektronische Daten] A fast and accurate method has been developed for measuring crystalline texture in homogeneous materials. The method uses a conventional powder x-ray diffractometer capable of θ scans. Two scans are recorded from the sample: first, a high resolution θ-2θ scan is obtained of a Bragg peak whose diffracting planes are normal to the preferred orientation direction; second, a θ scan is obtained using this peak. The η scan contains the required texture information, but the intensities must be corrected for defocusing and absorption to obtain the texture profile. The θ-2θ scan of the Bragg peak is used to make the defocusing correction, and first principles calculations are used to correct for absorption. The theory behind these corrections is presented here. The validity of the technique has been verified by making measurements on untextured alumina. Data obtained from Bi2Sr2Ca2Cu3O10 superconducting tape specimens with this technique are compared with texture data obtained with a four-circle diffractometer. Copyright © Materials Research Society 1998 Vaudin Mark D. NIST, Ceramics Division, Gaithersburg, Maryland 20899 Rupich Martin W. American Superconductor Corp., Two Technology Drive, Westborough, Massachusetts 01581 Jowett Martha American Superconductor Corp., Two Technology Drive, Westborough, Massachusetts 01581 Riley G. N. American Superconductor Corp., Two Technology Drive, Westborough, Massachusetts 01581 Bingert John F. Los Alamos National Lab, Materials Technology, Los Alamos, New Mexico 87545 Journal of Materials Research Cambridge University Press 13/10(1998-10), 2910-2919 0884-2914 13:10<2910 1998 13 JMR https://doi.org/10.1557/JMR.1998.0398 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1557/JMR.1998.0398 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Vaudin Mark D. NIST, Ceramics Division, Gaithersburg, Maryland 20899 NATIONALLICENCE 700 1- Rupich Martin W. American Superconductor Corp., Two Technology Drive, Westborough, Massachusetts 01581 NATIONALLICENCE 700 1- Jowett Martha American Superconductor Corp., Two Technology Drive, Westborough, Massachusetts 01581 NATIONALLICENCE 700 1- Riley G. N. American Superconductor Corp., Two Technology Drive, Westborough, Massachusetts 01581 NATIONALLICENCE 700 1- Bingert John F. Los Alamos National Lab, Materials Technology, Los Alamos, New Mexico 87545 NATIONALLICENCE 773 0- Journal of Materials Research Cambridge University Press 13/10(1998-10), 2910-2919 0884-2914 13:10<2910 1998 13 JMR CC0 http://creativecommons.org/publicdomain/zero/1.0 nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-cambridge