caa a22 4500 388019948 CHVBK 20180307124921.0 cr unu---uuuuu 161130e199804 xx s 000 0 eng 10.1557/JMR.1998.0140 doi S0884291400043776 pii (NATIONALLICENCE)cambridge-10.1557/JMR.1998.0140 Microstructure and optical loss in epitaxial (Pb, La)TiO3 thin films on (001) MgO [Elektronische Daten] Surface morphologies and microstructures of epitaxial (Pb1−xLax)TiO3 (PLT, x = 0.00, 0.08, 0.16, and 0.24) thin films grown on (001) MgO have been investigated using SEM, AFM, and TEM. Surface roughness of PLT films varies severely with La concentration. For 0.08La-PLT film, very smooth surface has been achieved with 9.3 Å of RMS roughness. 0.00La- and 0.08La-PLT films show 90° domain structure, and periodic dimension of the domain is reduced by La substitution. 0.16La- and 0.24La-PLT films show the presence of triangular grains, causing rough surface and poor crystal quality. However, they are distributed uniformly in 0.16La-PLT film while agglomerated in 0.24La-PLT film. Optical propagation losses of PLT films measured by prism coupling technique were 22.3, 6.0, 11.4, and 20.7 dB/cm for x = 0.00, 0.08, 0.16, and 0.24, respectively. Such a variation in optical losses seemed to be due to the surface morphology and abundance of domain boundaries that change continuously as a function of La concentration in epitaxial PLT thin films. Copyright © Materials Research Society 1998 Kang Young Min Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784, Korea Baik Sunggi Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784, Korea Journal of Materials Research Cambridge University Press 13/4(1998-04), 995-1001 0884-2914 13:4<995 1998 13 JMR https://doi.org/10.1557/JMR.1998.0140 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1557/JMR.1998.0140 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Kang Young Min Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784, Korea NATIONALLICENCE 700 1- Baik Sunggi Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784, Korea NATIONALLICENCE 773 0- Journal of Materials Research Cambridge University Press 13/4(1998-04), 995-1001 0884-2914 13:4<995 1998 13 JMR CC0 http://creativecommons.org/publicdomain/zero/1.0 nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-cambridge