caa a22 4500 39756970X CHVBK 20180308164837.0 cr unu---uuuuu 161202e199610 xx s 000 0 eng 10.1093/oxfordjournals.jmicro.a023455 doi (NATIONALLICENCE)oxford-10.1093/oxfordjournals.jmicro.a023455 Atomic Structure of a Defect Colony in Silicon Introduced during Neutron Irradiation in the JOYO Reactor [Elektronische Daten] [Yutaka Ohno, Mitsuji Hirata, Seiji Takeda, Ryoji Fujimoto, Ryuichiro Oshima] The structure of extended defects in a silicon crystal introduced during fission-neutron irradiation at 700 K in the JOYO fast breeder-type reactor have been examined by transmission electron diffraction using imaging plates and high-resolution electron microscopy. Defects of different nature, i.e. {113} self-interstitial, and vacancy Frank and stacking fault tetrahedra defects, were observed in the defect colony. This observation revealed a novel distribution of extended defects; that defects of different nature coexist in a microscopic area rather than being mutually annihilated. © 1996 Oxford University Press Full-length Papers nationallicence silicon nationallicence vacancy nationallicence high-resolution electron microscopy nationallicence imaging plate nationallicence neutron irradiation nationallicence Ohno Yutaka Department of Physics, Graduate School of Science, Osaka University 1-16 Machlkane-yama, Toyonaka, Osaka, 560 Japan aut Hirata Mitsuji Department of Physics, Graduate School of Science, Osaka University 1-16 Machlkane-yama, Toyonaka, Osaka, 560 Japan aut Takeda Seiji Department of Physics, Graduate School of Science, Osaka University 1-16 Machlkane-yama, Toyonaka, Osaka, 560 Japan aut Fujimoto Ryoji Department of Materials Physics, Faculty of Engineering Science, Osaka University 1-3 Machikane-yama, Toyonaka, Osaka, 560 Japan aut Oshima Ryuichiro Department of Materials Physics, Faculty of Engineering Science, Osaka University 1-3 Machikane-yama, Toyonaka, Osaka, 560 Japan aut Microscopy Oxford University Press 45/5(1996-10), 380-387 0022-0744 45:5<380 1996 45 jmicro https://doi.org/10.1093/oxfordjournals.jmicro.a023455 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1093/oxfordjournals.jmicro.a023455 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Ohno Yutaka Department of Physics, Graduate School of Science, Osaka University 1-16 Machlkane-yama, Toyonaka, Osaka, 560 Japan aut NATIONALLICENCE 700 1- Hirata Mitsuji Department of Physics, Graduate School of Science, Osaka University 1-16 Machlkane-yama, Toyonaka, Osaka, 560 Japan aut NATIONALLICENCE 700 1- Takeda Seiji Department of Physics, Graduate School of Science, Osaka University 1-16 Machlkane-yama, Toyonaka, Osaka, 560 Japan aut NATIONALLICENCE 700 1- Fujimoto Ryoji Department of Materials Physics, Faculty of Engineering Science, Osaka University 1-3 Machikane-yama, Toyonaka, Osaka, 560 Japan aut NATIONALLICENCE 700 1- Oshima Ryuichiro Department of Materials Physics, Faculty of Engineering Science, Osaka University 1-3 Machikane-yama, Toyonaka, Osaka, 560 Japan aut NATIONALLICENCE 773 0- Microscopy Oxford University Press 45/5(1996-10), 380-387 0022-0744 45:5<380 1996 45 jmicro Metadata rights reserved CC BY-NC-4.0 http://creativecommons.org/licenses/by-nc/4.0 nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-oxford