caa a22 4500 397569777 CHVBK 20180308164838.0 cr unu---uuuuu 161202e199608 xx s 000 0 eng 10.1093/oxfordjournals.jmicro.a023447 doi (NATIONALLICENCE)oxford-10.1093/oxfordjournals.jmicro.a023447 Development of γ-Type Energy Filtering TEM [Elektronische Daten] [Shunroku Taya, Yoshifumi Taniguchi, Eiko Nakazawa, Jiro Usukura] A new energy-filter is developed to improve image resolution and enhance the contrast of transmission electron microscopic (TEM) images. The filter consists of two sector magnetic fields and is built into a TEM column. Electrons travel through the filter following γ-shape trajectories. Electrons in a specific range of energies are selected and focused to produce an image. The energy filter was incorporated into a TEM for observation of unstained biological specimens. With a 1-μm thick specimen, zero-loss electrons produce a sharper, or less chromatic-aberration image compared with that of a conventional TEM. Meanwhile, with a thin specimen less than 0.1 μm thick, around 250eV-loss electrons produce a sharp image while zero-loss electrons do not. Observations show that a TEM equipped with the energy filter is useful for microscopy of fine structures of biological specimens under natural conditions. © 1996 Oxford University Press Full-length Papers nationallicence energy-filtering TEM nationallicence electron spectroscopic imaging nationallicence ESI nationallicence unstained biological specimens nationallicence γ-type energy filter nationallicence Taya Shunroku Hitachi Instruments Engineering Co. Ltd., 882 Ichige, Hitachinaka, Ibaraki, 312 Japan, 65 Tsurumai, Shouwa-ku, Nagoya, 466 Japan, 882 Ichige, Hitachinaka, Ibaraki, 312 Japan aut Taniguchi Yoshifumi Hitachi Instruments Engineering Co. Ltd., 882 Ichige, Hitachinaka, Ibaraki, 312 Japan, 65 Tsurumai, Shouwa-ku, Nagoya, 466 Japan, 882 Ichige, Hitachinaka, Ibaraki, 312 Japan aut Nakazawa Eiko Hitachi Instruments Engineering Co. Ltd. 882 Ichige, Hitachinaka, Ibaraki, 312 Japan aut Usukura Jiro School of Medicine, Nagoya University 65 Tsurumai, Shouwa-ku, Nagoya, 466 Japan aut Microscopy Oxford University Press 45/4(1996-08), 307-313 0022-0744 45:4<307 1996 45 jmicro https://doi.org/10.1093/oxfordjournals.jmicro.a023447 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1093/oxfordjournals.jmicro.a023447 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Taya Shunroku Hitachi Instruments Engineering Co. Ltd., 882 Ichige, Hitachinaka, Ibaraki, 312 Japan, 65 Tsurumai, Shouwa-ku, Nagoya, 466 Japan, 882 Ichige, Hitachinaka, Ibaraki, 312 Japan aut NATIONALLICENCE 700 1- Taniguchi Yoshifumi Hitachi Instruments Engineering Co. Ltd., 882 Ichige, Hitachinaka, Ibaraki, 312 Japan, 65 Tsurumai, Shouwa-ku, Nagoya, 466 Japan, 882 Ichige, Hitachinaka, Ibaraki, 312 Japan aut NATIONALLICENCE 700 1- Nakazawa Eiko Hitachi Instruments Engineering Co. Ltd. 882 Ichige, Hitachinaka, Ibaraki, 312 Japan aut NATIONALLICENCE 700 1- Usukura Jiro School of Medicine, Nagoya University 65 Tsurumai, Shouwa-ku, Nagoya, 466 Japan aut NATIONALLICENCE 773 0- Microscopy Oxford University Press 45/4(1996-08), 307-313 0022-0744 45:4<307 1996 45 jmicro Metadata rights reserved CC BY-NC-4.0 http://creativecommons.org/licenses/by-nc/4.0 nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-oxford