caa a22 4500 397569912 CHVBK 20180308164838.0 cr unu---uuuuu 161202e199602 xx s 000 0 eng 10.1093/oxfordjournals.jmicro.a023419 doi (NATIONALLICENCE)oxford-10.1093/oxfordjournals.jmicro.a023419 Short-Range Ordered Structure of Ga0.47In0.53 As Studied by Energy-Filtered Electron Diffraction and HREM [Elektronische Daten] [Daisuke Shindo, Akiko Gomyo, Jianm-Min Zuo, John C. H. Spence] An ordered structure of a III-V alloy semiconductor Ga0.47In0.53 As was investigated by electron diffraction and high-resolution electron microscopy (HREM). In order to investigate detailed intensity distributions of diffuse scattering in electron diffraction patterns, an omega-type energy filter and a cold stage were used. It is shown that the background, which arises from plasmon scattering and thermal diffuse scattering is drastically reduced, and the detailed shape and intensity distribution of the diffuse scattering have been revealed. By processing an HREM image, the short-range ordered structure, which is considered to result from the ordering of Ga and In, was clearly revealed. A comparison of the intensity distribution of the diffuse scattering in Al0.48In0.52As with that in Ga0.47In0.53As is briefly discussed, and a simple structure model is derived from the HREM image. © 1996 Oxford University Press Articles nationallicence image processing nationallicence imaging plate nationallicence diffuse scattering nationallicence short-range ordered structure nationallicence energy filtering nationallicence Shindo Daisuke Institute for Advanced Materials Processing, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendui, 980-77 Japan, 34 Miyukigaoka, Tsukuba, Ibaraki, 305 Japan, Tempe, AZ 85287, U.S.A. aut Gomyo Akiko Opto-Electronics Research Laboratories, NEC Corporation 34 Miyukigaoka, Tsukuba, Ibaraki, 305 Japan aut Zuo Jianm-Min Department of Physics, Arizona State University Tempe, AZ 85287, U.S.A. aut Spence John C. H. Department of Physics, Arizona State University Tempe, AZ 85287, U.S.A. aut Microscopy Oxford University Press 45/1(1996-02), 99-104 0022-0744 45:1<99 1996 45 jmicro https://doi.org/10.1093/oxfordjournals.jmicro.a023419 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1093/oxfordjournals.jmicro.a023419 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Shindo Daisuke Institute for Advanced Materials Processing, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendui, 980-77 Japan, 34 Miyukigaoka, Tsukuba, Ibaraki, 305 Japan, Tempe, AZ 85287, U.S.A aut NATIONALLICENCE 700 1- Gomyo Akiko Opto-Electronics Research Laboratories, NEC Corporation 34 Miyukigaoka, Tsukuba, Ibaraki, 305 Japan aut NATIONALLICENCE 700 1- Zuo Jianm-Min Department of Physics, Arizona State University Tempe, AZ 85287, U.S.A aut NATIONALLICENCE 700 1- Spence John C. H. Department of Physics, Arizona State University Tempe, AZ 85287, U.S.A aut NATIONALLICENCE 773 0- Microscopy Oxford University Press 45/1(1996-02), 99-104 0022-0744 45:1<99 1996 45 jmicro Metadata rights reserved CC BY-NC-4.0 http://creativecommons.org/licenses/by-nc/4.0 nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-oxford