caa a22 4500 397569939 CHVBK 20180308164838.0 cr unu---uuuuu 161202e199602 xx s 000 0 eng 10.1093/oxfordjournals.jmicro.a023415 doi (NATIONALLICENCE)oxford-10.1093/oxfordjournals.jmicro.a023415 Study of Electron-Irradiation-Induced Defects in GaP by In-situ Optical Spectroscopy in a Transmission Electron Microscope [Elektronische Daten] [Yutaka Ohno, Seiji Takeda] Electron-irradiation-induced defects in GaP were investigated by utilizing an in-situ transmission electron microscopy/photoluminescence (TEM/PL) observation apparatus, which enables us to obtain simultaneously TEM images and PL/cathodoluminescence (CL) spectra. The results of in-situ PL/CL spectroscopy under electron-irradiation show that the luminescence intensities, measured at the wavelengths of 565, 725 and 850 nm, remain the same during irradiation at 20 K. The intensities, however, decrease by annealing at 90 K after irradiation at 20 K. The data indicate that Frenkel defects, introduced in GaP by electron-irradiation at 20K, are no longer frozen in the temperature range from 20 to 90K and that thermal migration of interstitial atoms results in the formation of complexes associated with a non-radiative recombination center. Under electron-irradiation, the luminescence intensities measured at 90 K decrease with the electron dose. Analyses of the decrease-rates suggest that the complexes should be associated with two or more interstitial atoms. © 1996 Oxford University Press Articles nationallicence GaP nationallicence Frenkel defect nationallicence PL nationallicence CL nationallicence TEM nationallicence Ohno Yutaka Department of Physics, Graduate School of Science, Osaka University, 1-16, Machikane-yama, Toyonaka, Osaka, 560 Japan aut Takeda Seiji Department of Physics, Graduate School of Science, Osaka University, 1-16, Machikane-yama, Toyonaka, Osaka, 560 Japan aut Microscopy Oxford University Press 45/1(1996-02), 73-78 0022-0744 45:1<73 1996 45 jmicro https://doi.org/10.1093/oxfordjournals.jmicro.a023415 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1093/oxfordjournals.jmicro.a023415 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Ohno Yutaka Department of Physics, Graduate School of Science, Osaka University, 1-16, Machikane-yama, Toyonaka, Osaka, 560 Japan aut NATIONALLICENCE 700 1- Takeda Seiji Department of Physics, Graduate School of Science, Osaka University, 1-16, Machikane-yama, Toyonaka, Osaka, 560 Japan aut NATIONALLICENCE 773 0- Microscopy Oxford University Press 45/1(1996-02), 73-78 0022-0744 45:1<73 1996 45 jmicro Metadata rights reserved CC BY-NC-4.0 http://creativecommons.org/licenses/by-nc/4.0 nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-oxford