caa a22 4500 397569971 CHVBK 20180308164838.0 cr unu---uuuuu 161202e199602 xx s 000 0 eng 10.1093/oxfordjournals.jmicro.a023417 doi (NATIONALLICENCE)oxford-10.1093/oxfordjournals.jmicro.a023417 Slow-Scan CCD Camera Analysis of Electron Diffraction and High-Resolution Micrographs of Zeolite TPA/ZSM-5 [Elektronische Daten] [Naoyuki Ohnishi, Kenji Hiraga] We demonstrate herein the application of a slow-scan CCD camera attached to a 400 kV high-resolution transmission electron microscope for improvement in the experimental resolution of contrast details in the synthetic zeolite structure ZSM-5 (MFI). The additionally resolved contrast features are shown to be due to the presence of organic TPA+ (tetrapropylammonium) ions in the structural cages (channels) of the atomic framework of this material. The improvement in the amount and quality of structural detail through the use of the CCD camera is also shown by a comparison of a Fourier synthesis, made by using the observed electron diffraction intensities, with another one calculated by using a structure model based on X-ray measurements. The phases for both Fourier maps were calculated from the X-ray data. A comparison of the two Fourier calculations results in a good agreement. R-factors based on the normalized diffraction intensities have also been employed to evaluate the result of the structure analysis. © 1996 Oxford University Press Articles nationallicence CCD camera nationallicence zeolite nationallicence high-resolution electron microscopy nationallicence electron diffraction nationallicence crystal structure analysis nationallicence Ohnishi Naoyuki Institute for Materials Research, Tohoku University, Sendai, 980-77 Japan aut Hiraga Kenji Institute for Materials Research, Tohoku University, Sendai, 980-77 Japan aut Microscopy Oxford University Press 45/1(1996-02), 85-92 0022-0744 45:1<85 1996 45 jmicro https://doi.org/10.1093/oxfordjournals.jmicro.a023417 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1093/oxfordjournals.jmicro.a023417 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Ohnishi Naoyuki Institute for Materials Research, Tohoku University, Sendai, 980-77 Japan aut NATIONALLICENCE 700 1- Hiraga Kenji Institute for Materials Research, Tohoku University, Sendai, 980-77 Japan aut NATIONALLICENCE 773 0- Microscopy Oxford University Press 45/1(1996-02), 85-92 0022-0744 45:1<85 1996 45 jmicro Metadata rights reserved CC BY-NC-4.0 http://creativecommons.org/licenses/by-nc/4.0 nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-oxford