caa a22 4500 39756998X CHVBK 20180308164838.0 cr unu---uuuuu 161202e199602 xx s 000 0 eng 10.1093/oxfordjournals.jmicro.a023411 doi (NATIONALLICENCE)oxford-10.1093/oxfordjournals.jmicro.a023411 Colliex Christian Laboratoire de Physique da Solldes associé au CNRS, Baā 510, Université Paris-Sud, 91405 Orsay, France New Trends in STEM-Based Nano-EELS Analysis [Elektronische Daten] [Christian Colliex] Electron energy loss spectroscopy, when coupled to a field emission STEM offers unique perspectives for subnanometer analysis of inhomogeneous specimens. The present contribution points out how the convergence of progress in instrumentation (practical realization of the spectrum-image mode for data acquisition and processing) and in theory (improvement of the understanding of near-edge fine structures) opens the way to the mapping of electronic, bonding, structural and chemical information with a near-atomic spatial resolution, as demonstrated with an example involving a complex nanoparticle. © 1996 Oxford University Press Articles nationallicence nanoanalysis nationallicence electron energy loss spectroscopy nationallicence data analysis nationallicence nanostructures nationallicence Microscopy Oxford University Press 45/1(1996-02), 44-50 0022-0744 45:1<44 1996 45 jmicro https://doi.org/10.1093/oxfordjournals.jmicro.a023411 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1093/oxfordjournals.jmicro.a023411 text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Colliex Christian Laboratoire de Physique da Solldes associé au CNRS, Baā 510, Université Paris-Sud, 91405 Orsay, France NATIONALLICENCE 773 0- Microscopy Oxford University Press 45/1(1996-02), 44-50 0022-0744 45:1<44 1996 45 jmicro Metadata rights reserved CC BY-NC-4.0 http://creativecommons.org/licenses/by-nc/4.0 nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-oxford