caa a22 4500 397570023 CHVBK 20180308164838.0 cr unu---uuuuu 161202e199602 xx s 000 0 eng 10.1093/oxfordjournals.jmicro.a023414 doi (NATIONALLICENCE)oxford-10.1093/oxfordjournals.jmicro.a023414 Imaging of Transition Radiation from Thin Films on a Silicon Substrate Using a Light Detection System Combined with TEM [Elektronische Daten] [Naoki Yamamoto, Akio Toda, Katsuhiro Axaya] Transition radiation from a thin film on a silicon substrate was studied using a light detection and imaging system combined with a transmission electron microscope (TEM). Emission spectra show characteristic features due to the effect of substrate, which change with accelerating voltage and film thickness. Monochromatic photon images reveal contrast between the regions with different dielectric properties and also at surface structures such as steps and film edges. © 1996 Oxford University Press Articles nationallicence transition radiation nationallicence Cherenkov radiation nationallicence transmission electron microscopy nationallicence cathodoluminescence nationallicence Yamamoto Naoki Department of Physics, Tokyo Institute of Technology, 2-12-1 Oh-okayama, Meguro-ku, Tokyo, 152 Japan aut Toda Akio Department of Physics, Tokyo Institute of Technology, 2-12-1 Oh-okayama, Meguro-ku, Tokyo, 152 Japan aut Axaya Katsuhiro Department of Physics, Tokyo Institute of Technology, 2-12-1 Oh-okayama, Meguro-ku, Tokyo, 152 Japan aut Microscopy Oxford University Press 45/1(1996-02), 64-72 0022-0744 45:1<64 1996 45 jmicro https://doi.org/10.1093/oxfordjournals.jmicro.a023414 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1093/oxfordjournals.jmicro.a023414 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Yamamoto Naoki Department of Physics, Tokyo Institute of Technology, 2-12-1 Oh-okayama, Meguro-ku, Tokyo, 152 Japan aut NATIONALLICENCE 700 1- Toda Akio Department of Physics, Tokyo Institute of Technology, 2-12-1 Oh-okayama, Meguro-ku, Tokyo, 152 Japan aut NATIONALLICENCE 700 1- Axaya Katsuhiro Department of Physics, Tokyo Institute of Technology, 2-12-1 Oh-okayama, Meguro-ku, Tokyo, 152 Japan aut NATIONALLICENCE 773 0- Microscopy Oxford University Press 45/1(1996-02), 64-72 0022-0744 45:1<64 1996 45 jmicro Metadata rights reserved CC BY-NC-4.0 http://creativecommons.org/licenses/by-nc/4.0 nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-oxford