caa a22 4500 39757018X CHVBK 20180308164839.0 cr unu---uuuuu 161202e199604 xx s 000 0 eng 10.1093/oxfordjournals.jmicro.a023424 doi (NATIONALLICENCE)oxford-10.1093/oxfordjournals.jmicro.a023424 Measurement of Luminous Broadening with Sandwich-Structure Fluorescent Plates [Elektronische Daten] [Ryuji Nishi, Kiyokazu Yoshida, Akio Takaoka] To clarify the luminous broadening in each depth of YAG fluorescent plates, a thin Al film is sandwiched between two YAG plates. Electrons scattered in the top YAG layer can pass through the Al film, but the luminescence in the top YAG layer is isolated by the Al film. The luminescence only in the bottom YAG layer is detected. The luminous broadening or the image resolution is evaluated by a rise width of an edge spread function. The feature of luminous distributions is examined for the incident beam of 0.5, 1.0 and 2.0 MeV. It is seen that the luminescence near the incident surface affects the image resolution more strongly than that near the bottom surface in the case of transparent fluorescent plates. This means that higher resolution can be achieved with transparent plates than with opaque plates. © 1996 Oxford University Press Full-length Papers nationallicence YAG nationallicence resolution nationallicence luminous broadening nationallicence edge spread function nationallicence electron microscope nationallicence Nishi Ryuji Department of Electronic Engineering, Faculty of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka, 565 Japan, 2-1 Yamada-oka, Suita, Osaka, 565 Japan aut Yoshida Kiyokazu Research Center for Ultra-High Voltage Electron Microscopy, Osaka University 2-1 Yamada-oka, Suita, Osaka, 565 Japan aut Takaoka Akio Research Center for Ultra-High Voltage Electron Microscopy, Osaka University 2-1 Yamada-oka, Suita, Osaka, 565 Japan aut Microscopy Oxford University Press 45/2(1996-04), 148-151 0022-0744 45:2<148 1996 45 jmicro https://doi.org/10.1093/oxfordjournals.jmicro.a023424 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1093/oxfordjournals.jmicro.a023424 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Nishi Ryuji Department of Electronic Engineering, Faculty of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka, 565 Japan, 2-1 Yamada-oka, Suita, Osaka, 565 Japan aut NATIONALLICENCE 700 1- Yoshida Kiyokazu Research Center for Ultra-High Voltage Electron Microscopy, Osaka University 2-1 Yamada-oka, Suita, Osaka, 565 Japan aut NATIONALLICENCE 700 1- Takaoka Akio Research Center for Ultra-High Voltage Electron Microscopy, Osaka University 2-1 Yamada-oka, Suita, Osaka, 565 Japan aut NATIONALLICENCE 773 0- Microscopy Oxford University Press 45/2(1996-04), 148-151 0022-0744 45:2<148 1996 45 jmicro Metadata rights reserved CC BY-NC-4.0 http://creativecommons.org/licenses/by-nc/4.0 nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-oxford