caa a22 4500 397570279 CHVBK 20180308164839.0 cr unu---uuuuu 161202e199604 xx s 000 0 eng 10.1093/oxfordjournals.jmicro.a023423 doi (NATIONALLICENCE)oxford-10.1093/oxfordjournals.jmicro.a023423 Kimoto Koji Hitachi Research Laboratory, Hitachi Ltd., Ibaraki, 319-12 Japan Quantitative Elemental Mapping of Stainless Steel Using an Imaging Filter [Elektronische Daten] [Koji Kimoto] The elemental mapping of a sensitized stainless steel has been performed using a field emission transmission electron microscope equipped with an imaging filter. Quantification of an elemental map is performed on the basis of three energy filtered images for each element within the thickness range of 0.3 to 0.5 times the mean free path of the inelastic scattering. For Cr, Fe and Ni, quantitative elemental maps are observed near the grain boundary. The results agree fairly well with those obtained using TEM with EDX. © 1996 Oxford University Press Full-length Papers nationallicence elemental map nationallicence electron energy loss spectroscopy (EELS) nationallicence imaging filter nationallicence energy filter nationallicence field emission transmission electron microscope (FE-TEM) nationallicence Microscopy Oxford University Press 45/2(1996-04), 143-147 0022-0744 45:2<143 1996 45 jmicro https://doi.org/10.1093/oxfordjournals.jmicro.a023423 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1093/oxfordjournals.jmicro.a023423 text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Kimoto Koji Hitachi Research Laboratory, Hitachi Ltd., Ibaraki, 319-12 Japan NATIONALLICENCE 773 0- Microscopy Oxford University Press 45/2(1996-04), 143-147 0022-0744 45:2<143 1996 45 jmicro Metadata rights reserved CC BY-NC-4.0 http://creativecommons.org/licenses/by-nc/4.0 nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-oxford