caa a22 4500 39757035X CHVBK 20180308164839.0 cr unu---uuuuu 161202e199606 xx s 000 0 eng 10.1093/oxfordjournals.jmicro.a023432 doi (NATIONALLICENCE)oxford-10.1093/oxfordjournals.jmicro.a023432 Onozuka Takashi Niigata Institute of Technology, 1719 Fujihashi, Kashiwazaki 945-12 Japan Photometric Measurements for Periodic Two-Domain-Configurations of the "Incommensurate” Structure of Bi2Sr2(Ca1−xPrx)Cu2O8+δ [Elektronische Daten] [Takashi Onozuka] The "incommensurate” phase Bi2Sr2(Ca1−xPrx)Cu2O8+δ was characterized by closely examining a photometric density distribution which measures one-dimensional spot-brightness modulations of [001] high-resolution transmission electron microscope (TEM) images. Periodic configurations of two short units of b = 4.5b0 and b = 5b0 or of b = 4.5b0 and 4b0 were found in the measured photometric curves. The presence of experimental modulation periods in slight differences is attributed to the formation of long-period modulated structures (LPMSs) owning their characteristic domain configurations in the crystals. The LPMSs have a long superlattice unit in a range of b = 12-20nm, namely, a period of domain configuration. It is difficult to determine the domain configuration on the basis of only diffraction data on the single crystal of the "incommensurate” phase. © 1996 Oxford University Press Full-length Papers nationallicence high-resolution transmission electron microscopy nationallicence spot-brightness modulation nationallicence photometric density-distribution curve nationallicence periodic two-domain-configuration nationallicence Bi2Sr2(Ca1−xPrx)-Cu2O8+δ nationallicence Microscopy Oxford University Press 45/3(1996-06), 195-201 0022-0744 45:3<195 1996 45 jmicro https://doi.org/10.1093/oxfordjournals.jmicro.a023432 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1093/oxfordjournals.jmicro.a023432 text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Onozuka Takashi Niigata Institute of Technology, 1719 Fujihashi, Kashiwazaki 945-12 Japan NATIONALLICENCE 773 0- Microscopy Oxford University Press 45/3(1996-06), 195-201 0022-0744 45:3<195 1996 45 jmicro Metadata rights reserved CC BY-NC-4.0 http://creativecommons.org/licenses/by-nc/4.0 nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-oxford