caa a22 4500 397570368 CHVBK 20180308164839.0 cr unu---uuuuu 161202e199606 xx s 000 0 eng 10.1093/oxfordjournals.jmicro.a023437 doi (NATIONALLICENCE)oxford-10.1093/oxfordjournals.jmicro.a023437 Sensitivity and Fading Characteristics of the 25 μm Pixel Size Imaging Plate for Transmission Electron Microscopes [Elektronische Daten] [Akira Taniyama, Daisuke Shindo, Tetsuo Oikawa] The sensitivity and fading characteristics of the new IP, which had a pixel size of 25 μm × 25 μm, were measured to calibrate the read-out intensity in quantitative analysis and to estimate the read-out efficiency of an IP-reader. The sensitivity showed good linearity in electron dose and a wide dynamic range of about five orders. However, the effective dynamic range was restricted to about four orders under one gain condition of the IP-reader. The fading characteristic of the new IP was independent of the electron intensity, and the decrease of the read-out intensity due to the fading was smaller than with the old IP which had a pixel size of 50 μm × 50 μm. Furthermore, the fading characteristic caused by repeated read-out was independent of the electron intensity, and the read-out intensity did not reach zero after read-out was repeated 10 times. © 1996 Oxford University Press Letters nationallicence Imaging Plate nationallicence fading nationallicence quantitative analysis nationallicence repeated read-out nationallicence transmission electron microscope nationallicence Taniyama Akira JEOL Ltd., 1-2 Musashmo 3 chome, Akishima, Tokyo, 196 Japan, Katahira, Sendai 980-77 Japan aut Shindo Daisuke JEOL Ltd., 1-2 Musashmo 3 chome, Akishima, Tokyo, 196 Japan, Katahira, Sendai 980-77 Japan aut Oikawa Tetsuo JEOL Ltd. 1-2 Musashmo 3 chome, Akishima, Tokyo, 196 Japan aut Microscopy Oxford University Press 45/3(1996-06), 232-235 0022-0744 45:3<232 1996 45 jmicro https://doi.org/10.1093/oxfordjournals.jmicro.a023437 text/html Onlinezugriff via DOI 1 article jats NATIONALLICENCE 856 40 https://doi.org/10.1093/oxfordjournals.jmicro.a023437 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Taniyama Akira JEOL Ltd., 1-2 Musashmo 3 chome, Akishima, Tokyo, 196 Japan, Katahira, Sendai 980-77 Japan aut NATIONALLICENCE 700 1- Shindo Daisuke JEOL Ltd., 1-2 Musashmo 3 chome, Akishima, Tokyo, 196 Japan, Katahira, Sendai 980-77 Japan aut NATIONALLICENCE 700 1- Oikawa Tetsuo JEOL Ltd. 1-2 Musashmo 3 chome, Akishima, Tokyo, 196 Japan aut NATIONALLICENCE 773 0- Microscopy Oxford University Press 45/3(1996-06), 232-235 0022-0744 45:3<232 1996 45 jmicro Metadata rights reserved CC BY-NC-4.0 http://creativecommons.org/licenses/by-nc/4.0 nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-oxford