From Scalar DWI to DTI and Beyond: Advantages and Pitfalls of Increasingly Complex Techniques

Verfasser / Beitragende:
[P. Hagmann, V. Wedeen, P. Maeder, J.-P. Thiran, R. Meuli]
Ort, Verlag, Jahr:
2005
Enthalten in:
2005.11.27-12.02 RSNA 2005 Radiological Society of North America, 91st Scientific Assembly and Annual Meeting, McCormick Place, Chicago, Illinois, USA. Prize RSNA Poster: Award E: Excellence in Design, Award RG: Selected for RadioGraphics
Format:
Artikel
ID: 43948121X