Water-related charge carrier traps in thermal silicon dioxide films prepared in dry oxygen

Verfasser / Beitragende:
[A. Emel'yanov]
Ort, Verlag, Jahr:
2010
Enthalten in:
Physics of the Solid State, 52/6(2010-06-01), 1131-1137
Format:
Artikel (online)
ID: 445109688