Mapping Residual Stress Distributions at the Micron Scale in Amorphous Materials

Verfasser / Beitragende:
[Bartlomiej Winiarski, Richard Langford, Jiawan Tian, Yoshihiko Yokoyama, Peter Liaw, Philip Withers]
Ort, Verlag, Jahr:
2010
Enthalten in:
Metallurgical and Materials Transactions A, 41/7(2010-07-01), 1743-1751
Format:
Artikel (online)
ID: 445117664