Applications of X-Ray Characterization for Advanced Materials in the Electronics Industry

Verfasser / Beitragende:
[A. Vigliante, N. Kasper, J. Brechbuehl, E. Nolot]
Ort, Verlag, Jahr:
2010
Enthalten in:
Metallurgical and Materials Transactions A, 41/5(2010-05-01), 1167-1173
Format:
Artikel (online)
ID: 44511939X