Predicting Fracture Toughness of TRIP 800 Using Phase Properties Characterized by In-Situ High-Energy X-Ray Diffraction

Verfasser / Beitragende:
[A. Soulami, K.S. Choi, W.N. Liu, X. Sun, M.A. Khaleel, Y. Ren, Y.D. Wang]
Ort, Verlag, Jahr:
2010
Enthalten in:
Metallurgical and Materials Transactions A, 41/5(2010-05-01), 1261-1268
Format:
Artikel (online)
ID: 445119438