Studying electric field profiles in GaAs-based detector structures by Kelvin probe force microscopy

Verfasser / Beitragende:
[M. Vilisova, V. Germogenov, O. Kaztaev, V. Novikov, I. Ponomarev, A. Titkov]
Ort, Verlag, Jahr:
2010
Enthalten in:
Technical Physics Letters, 36/5(2010-05-01), 436-438
Format:
Artikel (online)
ID: 445130385