Use of TOF-SIMS to study adsorption and loading behavior of methylene blue and papain in a nano-porous silicon layer

Verfasser / Beitragende:
[Ivan Kempson, Timothy Barnes, Clive Prestidge]
Ort, Verlag, Jahr:
2010
Enthalten in:
Journal of the American Society for Mass Spectrometry, 21/2(2010-02-01), 254-260
Format:
Artikel (online)
ID: 445172568