caa a22 4500 445303107 CHVBK 20180317142604.0 cr unu---uuuuu 170323e20100101xx s 000 0 eng 10.1007/s12274-010-1006-4 doi (NATIONALLICENCE)springer-10.1007/s12274-010-1006-4 In situ imaging of layer-by-layer sublimation of suspended graphene [Elektronische Daten] [Jian Huang, Liang Qi, Ju Li] An individual suspended graphene sheet was connected to a scanning tunneling microscopy probe inside a transmission electron microscope, and Joule heated to high temperatures. At high temperatures and under electron beam irradiation, the few-layer graphene sheets were removed layer-by-layer in the viewing area until a monolayer graphene was formed. The layer-by-layer peeling was initiated at vacancies in individual graphene layers. The vacancies expanded to form nanometer-sized holes, which then grew along the perimeter and propagated to both the top and bottom layers of a bilayer graphene joined by a bilayer edge. The layer-by-layer peeling was induced by atom sublimation caused by Joule heating and facilitated by atom displacement caused by high-energy electron irradiation, and may be harnessed to control the layer thickness of graphene for device applications. Tsinghua University Press and Springer Berlin Heidelberg, 2010 Graphene nationallicence sublimation nationallicence in situ electron microscopy nationallicence vacancy hole nationallicence bilayer edge nationallicence Huang Jian Center for Integrated Nanotechnologies (CINT), Sandia National Laboratories, 87185, Albuquerque, New Mexico, USA aut Qi Liang Department of Materials Science and Engineering, University of Pennsylvania, 19104, Philadelphia, Pennsylvania, USA aut Li Ju Department of Materials Science and Engineering, University of Pennsylvania, 19104, Philadelphia, Pennsylvania, USA aut Nano Research Tsinghua Press 3/1(2010-01-01), 43-50 1998-0124 3:1<43 2010 3 12274 https://doi.org/10.1007/s12274-010-1006-4 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s12274-010-1006-4 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Huang Jian Center for Integrated Nanotechnologies (CINT), Sandia National Laboratories, 87185, Albuquerque, New Mexico, USA aut NATIONALLICENCE 700 1- Qi Liang Department of Materials Science and Engineering, University of Pennsylvania, 19104, Philadelphia, Pennsylvania, USA aut NATIONALLICENCE 700 1- Li Ju Department of Materials Science and Engineering, University of Pennsylvania, 19104, Philadelphia, Pennsylvania, USA aut NATIONALLICENCE 773 0- Nano Research Tsinghua Press 3/1(2010-01-01), 43-50 1998-0124 3:1<43 2010 3 12274 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer