caa a22 4500 445305274 CHVBK 20180317142611.0 cr unu---uuuuu 170323e20110701xx s 000 0 eng 10.1007/s10762-011-9808-3 doi (NATIONALLICENCE)springer-10.1007/s10762-011-9808-3 The Influence of a Coupling Film on Ultra-Low-Loss Dielectric Measurement Using an Open Resonator [Elektronische Daten] [Guofen Yu, Jyotsna Dutta, Charles Jones, Yuanci Gao] A Fabry-Perot open resonator excited through a coupling film and loaded with a plane-parallel dielectric plate is analyzed. The eigen equation of the field in the resonator is obtained. The quality factors of the resonator with and without a coupling film are compared. The quality factors of the resonator loaded with a plate that is in resonance and off resonance are also compared. It is shown that the difference in coupling losses between a loaded resonator and an unloaded resonator may strongly affect the accuracy in measuring ultra-low loss dielectric material. Some ways to reduce the influence of coupling loss are discussed. Our experiment results are consistent with the numerical analysis. Springer Science+Business Media, LLC, 2011 Open resonator nationallicence Quality factor nationallicence Ultra-low loss-tangent measurement nationallicence Coupling film nationallicence Yu Guofen Physical Sciences, The University of Findlay, 1000 N. Main Street, OH 45840, Findlay, USA aut Dutta Jyotsna Physics Department, North Caroline Central University, 1801 Fayetteville, NC 27707, St. Durham, USA aut Jones Charles Physics Department, North Caroline Central University, 1801 Fayetteville, NC 27707, St. Durham, USA aut Gao Yuanci University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, 610054, Chengdu, People's Republic of China aut Journal of Infrared, Millimeter, and Terahertz Waves Springer US; http://www.springer-ny.com 32/7(2011-07-01), 935-942 1866-6892 32:7<935 2011 32 10762 https://doi.org/10.1007/s10762-011-9808-3 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10762-011-9808-3 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Yu Guofen Physical Sciences, The University of Findlay, 1000 N. Main Street, OH 45840, Findlay, USA aut NATIONALLICENCE 700 1- Dutta Jyotsna Physics Department, North Caroline Central University, 1801 Fayetteville, NC 27707, St. Durham, USA aut NATIONALLICENCE 700 1- Jones Charles Physics Department, North Caroline Central University, 1801 Fayetteville, NC 27707, St. Durham, USA aut NATIONALLICENCE 700 1- Gao Yuanci University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, 610054, Chengdu, People's Republic of China aut NATIONALLICENCE 773 0- Journal of Infrared, Millimeter, and Terahertz Waves Springer US; http://www.springer-ny.com 32/7(2011-07-01), 935-942 1866-6892 32:7<935 2011 32 10762 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer