caa a22 4500 445305479 CHVBK 20180317142611.0 cr unu---uuuuu 170323e20110901xx s 000 0 eng 10.1007/s10762-011-9811-8 doi (NATIONALLICENCE)springer-10.1007/s10762-011-9811-8 Imaging and Analysis of THz Surface Plasmon Polariton Waves with the Integrated Sub-wavelength Aperture Probe [Elektronische Daten] [Raimund Mueckstein, Chris Graham, Cyril Renaud, Alwyn Seeds, James Harrington, Oleg Mitrofanov] We demonstrate that the integrated sub-wavelength aperture probe designed for THz near-field scanning probe microscopy can be used to map surface plasmon waves at THz frequencies. Observed near-field images of metallic patterns reveal surface plasmon waves superimposed over THz transmission images. We discuss the coupling mechanism for the surface waves and arrive to an important conclusion that the detected surface wave images represent the spatial derivative of the surface plasmon electric field. The relationship between the electric field and the measured signal is confirmed experimentally by mapping surface waves in bow-tie antennas. This study explains previously observed effects in THz near-field microscopy and provides a framework for analysis of near-field images. Springer Science+Business Media, LLC, 2011 Terahertz nationallicence Near-field nationallicence Surface waves nationallicence Surface plasmon polariton nationallicence Terahertz imaging nationallicence Antenna nationallicence Near-field probe nationallicence Sub-wavelength aperture nationallicence Mueckstein Raimund Department of Electronic and Electrical Engineering, University College London, Torrington Place, WC1E 7JE, London, UK aut Graham Chris Department of Electronic and Electrical Engineering, University College London, Torrington Place, WC1E 7JE, London, UK aut Renaud Cyril Department of Electronic and Electrical Engineering, University College London, Torrington Place, WC1E 7JE, London, UK aut Seeds Alwyn Department of Electronic and Electrical Engineering, University College London, Torrington Place, WC1E 7JE, London, UK aut Harrington James Department of Materials Science and Engineering, Rutgers University, 607 Taylor Rd., 08854, Piscataway, NJ, USA aut Mitrofanov Oleg Department of Electronic and Electrical Engineering, University College London, Torrington Place, WC1E 7JE, London, UK aut Journal of Infrared, Millimeter, and Terahertz Waves Springer US; http://www.springer-ny.com 32/8-9(2011-09-01), 1031-1042 1866-6892 32:8-9<1031 2011 32 10762 https://doi.org/10.1007/s10762-011-9811-8 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10762-011-9811-8 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Mueckstein Raimund Department of Electronic and Electrical Engineering, University College London, Torrington Place, WC1E 7JE, London, UK aut NATIONALLICENCE 700 1- Graham Chris Department of Electronic and Electrical Engineering, University College London, Torrington Place, WC1E 7JE, London, UK aut NATIONALLICENCE 700 1- Renaud Cyril Department of Electronic and Electrical Engineering, University College London, Torrington Place, WC1E 7JE, London, UK aut NATIONALLICENCE 700 1- Seeds Alwyn Department of Electronic and Electrical Engineering, University College London, Torrington Place, WC1E 7JE, London, UK aut NATIONALLICENCE 700 1- Harrington James Department of Materials Science and Engineering, Rutgers University, 607 Taylor Rd., 08854, Piscataway, NJ, USA aut NATIONALLICENCE 700 1- Mitrofanov Oleg Department of Electronic and Electrical Engineering, University College London, Torrington Place, WC1E 7JE, London, UK aut NATIONALLICENCE 773 0- Journal of Infrared, Millimeter, and Terahertz Waves Springer US; http://www.springer-ny.com 32/8-9(2011-09-01), 1031-1042 1866-6892 32:8-9<1031 2011 32 10762 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer