caa a22 4500 445366109 CHVBK 20180317142931.0 cr unu---uuuuu 170323e20110301xx s 000 0 eng 10.1007/s10909-010-0254-8 doi (NATIONALLICENCE)springer-10.1007/s10909-010-0254-8 Mechanical Response of 4He Films Adsorbed onGraphite with a Quartz Tuning Fork [Elektronische Daten] [F. Nihei, K. Ideura, H. Kobayashi, J. Taniguchi, M. Suzuki] We have carried out quartz-crystal microbalance (QCM) experiments of 32kHz quartz tuning fork for 4He films adsorbed on Grafoil, and have measured the temperature dependence of the resonance frequency and Q value for various areal densities. It was found that the frequency does not decrease exactly in proportion to the areal density. This means that the film still undergoes decoupling partly, although it is strongly suppressed from that of 5MHz QCM measurements. Above the three-atom thick film, the decoupling due to the superfluidity of the overlayer is observed. In addition, we found that the competition between the superfluidity and the slippage takes place for a large oscillation amplitude. From the comparison with 5MHz QCM measurements, it is concluded that the acceleration of substrate plays an important role in the slippage. Springer Science+Business Media, LLC, 2010 Quartz tuning fork nationallicence QCM nationallicence 4He film nationallicence Grafoil nationallicence Slippage nationallicence Superfluidity nationallicence Nihei F. Department of Applied Physics and Chemistry, University of Electro-Communications, 182-8585, Chofu, Tokyo, Japan aut Ideura K. Department of Applied Physics and Chemistry, University of Electro-Communications, 182-8585, Chofu, Tokyo, Japan aut Kobayashi H. Department of Applied Physics and Chemistry, University of Electro-Communications, 182-8585, Chofu, Tokyo, Japan aut Taniguchi J. Department of Applied Physics and Chemistry, University of Electro-Communications, 182-8585, Chofu, Tokyo, Japan aut Suzuki M. Department of Applied Physics and Chemistry, University of Electro-Communications, 182-8585, Chofu, Tokyo, Japan aut Journal of Low Temperature Physics Springer US; http://www.springer-ny.com 162/5-6(2011-03-01), 559-564 0022-2291 162:5-6<559 2011 162 10909 https://doi.org/10.1007/s10909-010-0254-8 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10909-010-0254-8 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Nihei F. Department of Applied Physics and Chemistry, University of Electro-Communications, 182-8585, Chofu, Tokyo, Japan aut NATIONALLICENCE 700 1- Ideura K. Department of Applied Physics and Chemistry, University of Electro-Communications, 182-8585, Chofu, Tokyo, Japan aut NATIONALLICENCE 700 1- Kobayashi H. Department of Applied Physics and Chemistry, University of Electro-Communications, 182-8585, Chofu, Tokyo, Japan aut NATIONALLICENCE 700 1- Taniguchi J. Department of Applied Physics and Chemistry, University of Electro-Communications, 182-8585, Chofu, Tokyo, Japan aut NATIONALLICENCE 700 1- Suzuki M. Department of Applied Physics and Chemistry, University of Electro-Communications, 182-8585, Chofu, Tokyo, Japan aut NATIONALLICENCE 773 0- Journal of Low Temperature Physics Springer US; http://www.springer-ny.com 162/5-6(2011-03-01), 559-564 0022-2291 162:5-6<559 2011 162 10909 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer