caa a22 4500 445370866 CHVBK 20180317142946.0 cr unu---uuuuu 170323e20111201xx s 000 0 eng 10.1007/s00340-011-4606-0 doi (NATIONALLICENCE)springer-10.1007/s00340-011-4606-0 Refractive index change mechanisms in swift-heavy-ion-implanted Nd:YAG waveguide [Elektronische Daten] [F. Qiu, T. Narusawa] A buried planar Nd:YAG waveguide has been fabricated by 20-MeV N-ion implantation. From Raman and optical characterization, it has been found that the refractive index has a larger increase when the crystal damage is heavier. According to our analysis, this crystal damage is caused by the electronic energy loss in the first several micrometers of irradiated regions, while nuclear energy loss also acts on the damage near the end of the ion range. This work is helpful to understand the mechanisms of swift-heavy-ion-implanted Nd:YAG waveguide formation. Springer-Verlag, 2011 Qiu F. Kochi University of Technology, Kami, 782-8502, Kochi, Japan aut Narusawa T. aut Applied Physics B Springer-Verlag 105/4(2011-12-01), 871-875 0946-2171 105:4<871 2011 105 340 https://doi.org/10.1007/s00340-011-4606-0 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s00340-011-4606-0 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Qiu F. Kochi University of Technology, Kami, 782-8502, Kochi, Japan aut NATIONALLICENCE 700 1- Narusawa T. aut NATIONALLICENCE 773 0- Applied Physics B Springer-Verlag 105/4(2011-12-01), 871-875 0946-2171 105:4<871 2011 105 340 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer