caa a22 4500 445370920 CHVBK 20180317142946.0 cr unu---uuuuu 170323e20111201xx s 000 0 eng 10.1007/s00340-011-4480-9 doi (NATIONALLICENCE)springer-10.1007/s00340-011-4480-9 Pulse characterization during femtosecond laser filamentation in air by two-photon fluorescence measurement [Elektronische Daten] [Y. Liu, Q. Wen, S. Xu, W. Liu, S. Chin] This work reports a temporal characteristic of a laser pulse undergoing filamentation in air. The diagnostic method is based on two-photon fluorescence measurement. The results show that the pulse duration, chirp rate and beam radius could be simultaneously quantitatively retrieved. This simple technique would be useful in practice to trace the underlying dynamics of filamentation in air. Springer-Verlag, 2011 Liu Y. Institute of Modern Optics, Nankai University, Key Laboratory of Opto-electronic Information Science and Technology, Education Ministry of China, 300071, Tianjin, China aut Wen Q. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic and Technology of China, 610054, Chengdu, China aut Xu S. Institute of Modern Optics, Nankai University, Key Laboratory of Opto-electronic Information Science and Technology, Education Ministry of China, 300071, Tianjin, China aut Liu W. Institute of Modern Optics, Nankai University, Key Laboratory of Opto-electronic Information Science and Technology, Education Ministry of China, 300071, Tianjin, China aut Chin S. Centre d'Optique, Photonique et Laser (COPL) et le Département de Physique, de Génie Physique et d'Optique, Université Laval, G1V 0A6, Québec, Québec, Canada aut Applied Physics B Springer-Verlag 105/4(2011-12-01), 825-831 0946-2171 105:4<825 2011 105 340 https://doi.org/10.1007/s00340-011-4480-9 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s00340-011-4480-9 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Liu Y. Institute of Modern Optics, Nankai University, Key Laboratory of Opto-electronic Information Science and Technology, Education Ministry of China, 300071, Tianjin, China aut NATIONALLICENCE 700 1- Wen Q. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic and Technology of China, 610054, Chengdu, China aut NATIONALLICENCE 700 1- Xu S. Institute of Modern Optics, Nankai University, Key Laboratory of Opto-electronic Information Science and Technology, Education Ministry of China, 300071, Tianjin, China aut NATIONALLICENCE 700 1- Liu W. Institute of Modern Optics, Nankai University, Key Laboratory of Opto-electronic Information Science and Technology, Education Ministry of China, 300071, Tianjin, China aut NATIONALLICENCE 700 1- Chin S. Centre d'Optique, Photonique et Laser (COPL) et le Département de Physique, de Génie Physique et d'Optique, Université Laval, G1V 0A6, Québec, Québec, Canada aut NATIONALLICENCE 773 0- Applied Physics B Springer-Verlag 105/4(2011-12-01), 825-831 0946-2171 105:4<825 2011 105 340 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer