caa a22 4500 445371196 CHVBK 20180317142947.0 cr unu---uuuuu 170323e20111101xx s 000 0 eng 10.1007/s00340-011-4645-6 doi (NATIONALLICENCE)springer-10.1007/s00340-011-4645-6 Detection of acetylene impurities in ethylene and polyethylene manufacturing processes using tunable diode laser spectroscopy in the 3-μm range [Elektronische Daten] [P. Kluczynski, M. Jahjah, L. Nähle, O. Axner, S. Belahsene, M. Fischer, J. Koeth, Y. Rouillard, J. Westberg, A. Vicet, S. Lundqvist] Using recently developed GaInAsSb/AlGaInAsSb DFB lasers, tunable diode laser spectroscopy (TDLS) has been extended into the 3-μm wavelength region for the detection of acetylene impurities in hydrocarbon compounds encountered in ethylene manufacturing. Measurements of acetylene in pure polymer grade ethylene and in a gas mixture of ethylene and ethane typical of the process stream around a hydrogenation reactor have been performed. Using a procedure incorporating subtraction of a hydrocarbon background spectrum a detection limit of 5ppb m was achieved under ordinary laboratory conditions. Under forced temperature cycling conditions, the detection limit deteriorated to 180 ppb m, due to temperature drift caused by optical interferences generated by reflections in the laser TO8 can. Springer-Verlag, 2011 Kluczynski P. Siemens AB, IIA SLA R&D, Box 14153, 400 20, Göteborg, Sweden aut Jahjah M. Institut d'Electronique du Sud, Université Montpellier 2, 34095, Montpellier, France aut Nähle L. Nanoplus GmbH, Oberer Kirschberg 4, 97218, Gerbrunn, Germany aut Axner O. Department of Physics, UmeåUniversity, 907 81, Umeå, Sweden aut Belahsene S. Institut d'Electronique du Sud, Université Montpellier 2, 34095, Montpellier, France aut Fischer M. Nanoplus GmbH, Oberer Kirschberg 4, 97218, Gerbrunn, Germany aut Koeth J. Nanoplus GmbH, Oberer Kirschberg 4, 97218, Gerbrunn, Germany aut Rouillard Y. Institut d'Electronique du Sud, Université Montpellier 2, 34095, Montpellier, France aut Westberg J. Department of Physics, UmeåUniversity, 907 81, Umeå, Sweden aut Vicet A. Institut d'Electronique du Sud, Université Montpellier 2, 34095, Montpellier, France aut Lundqvist S. Siemens AB, IIA SLA R&D, Box 14153, 400 20, Göteborg, Sweden aut Applied Physics B Springer-Verlag 105/2(2011-11-01), 427-434 0946-2171 105:2<427 2011 105 340 https://doi.org/10.1007/s00340-011-4645-6 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s00340-011-4645-6 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Kluczynski P. Siemens AB, IIA SLA R&D, Box 14153, 400 20, Göteborg, Sweden aut NATIONALLICENCE 700 1- Jahjah M. Institut d'Electronique du Sud, Université Montpellier 2, 34095, Montpellier, France aut NATIONALLICENCE 700 1- Nähle L. Nanoplus GmbH, Oberer Kirschberg 4, 97218, Gerbrunn, Germany aut NATIONALLICENCE 700 1- Axner O. Department of Physics, UmeåUniversity, 907 81, Umeå, Sweden aut NATIONALLICENCE 700 1- Belahsene S. Institut d'Electronique du Sud, Université Montpellier 2, 34095, Montpellier, France aut NATIONALLICENCE 700 1- Fischer M. Nanoplus GmbH, Oberer Kirschberg 4, 97218, Gerbrunn, Germany aut NATIONALLICENCE 700 1- Koeth J. Nanoplus GmbH, Oberer Kirschberg 4, 97218, Gerbrunn, Germany aut NATIONALLICENCE 700 1- Rouillard Y. Institut d'Electronique du Sud, Université Montpellier 2, 34095, Montpellier, France aut NATIONALLICENCE 700 1- Westberg J. Department of Physics, UmeåUniversity, 907 81, Umeå, Sweden aut NATIONALLICENCE 700 1- Vicet A. Institut d'Electronique du Sud, Université Montpellier 2, 34095, Montpellier, France aut NATIONALLICENCE 700 1- Lundqvist S. Siemens AB, IIA SLA R&D, Box 14153, 400 20, Göteborg, Sweden aut NATIONALLICENCE 773 0- Applied Physics B Springer-Verlag 105/2(2011-11-01), 427-434 0946-2171 105:2<427 2011 105 340 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer