caa a22 4500 445371471 CHVBK 20180317142948.0 cr unu---uuuuu 170323e20111101xx s 000 0 eng 10.1007/s00340-011-4463-x doi (NATIONALLICENCE)springer-10.1007/s00340-011-4463-x Detection of parametric resonance of trapped ions formicromotion compensation [Elektronische Daten] [Y. Ibaraki, U. Tanaka, S. Urabe] We have detected excess micromotion of trapped ions by modulating the trapping voltage. This radio-frequency (rf) modulation induces parametric resonance and excites secular motion of the trapped ions when they possess excess motion. This technique has been applied to laser-cooled ions in a linear rf trap and it provides optimum values for compensating the trapping field. We found that the technique has sensitivity equal to or greater than the conventional method for detecting excess micromotion. Because any laser propagation direction can be used, this method is expected to be applied to surface-electrode traps. Springer-Verlag, 2011 Ibaraki Y. Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyamacho, 560-8531, Osaka, Toyonaka, Japan aut Tanaka U. Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyamacho, 560-8531, Osaka, Toyonaka, Japan aut Urabe S. Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyamacho, 560-8531, Osaka, Toyonaka, Japan aut Applied Physics B Springer-Verlag 105/2(2011-11-01), 219-223 0946-2171 105:2<219 2011 105 340 https://doi.org/10.1007/s00340-011-4463-x text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s00340-011-4463-x text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Ibaraki Y. Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyamacho, 560-8531, Osaka, Toyonaka, Japan aut NATIONALLICENCE 700 1- Tanaka U. Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyamacho, 560-8531, Osaka, Toyonaka, Japan aut NATIONALLICENCE 700 1- Urabe S. Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyamacho, 560-8531, Osaka, Toyonaka, Japan aut NATIONALLICENCE 773 0- Applied Physics B Springer-Verlag 105/2(2011-11-01), 219-223 0946-2171 105:2<219 2011 105 340 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer