caa a22 4500 445372605 CHVBK 20180317142952.0 cr unu---uuuuu 170323e20110201xx s 000 0 eng 10.1007/s00340-010-4011-0 doi (NATIONALLICENCE)springer-10.1007/s00340-010-4011-0 VCSEL-based calibration-free carbon monoxide sensor at 2.3μm with in-line reference cell [Elektronische Daten] [J. Chen, A. Hangauer, R. Strzoda, M.-C. Amann] A compact and calibration-free carbon monoxide sensor approach utilizing the wide current-tunability of 2.3μm VCSELs is reported. A separate reference cell is avoided by filling the reference gas (methane) in the photodetector housing. By applying bandwidth optimized wide/narrow wavelength scan concept, inherent wavelength scale calibration and self-monitoring of the sensor are realized, with which the laser aging process is also under control. An efficient linear least-squares curve fit using an analytical signal model for the narrow scan spectrum is done, utilizing the knowledge of the absolute wavelength scale and also the estimated WMS modulation amplitude obtained from the wide scan. The scan width of the narrow spectrum is optimized aiming at the maximum signal to noise ratio on the determined CO concentration. These concepts are universal and can be utilized for optical sensing of other gases as well and the sensor was tested under diverse applications e.g. fire detection and combustion optimization. Springer-Verlag, 2010 Chen J. Corporate Technology, Siemens AG, Otto-Hahn-Ring 6, 80200, Munich, Germany aut Hangauer A. Corporate Technology, Siemens AG, Otto-Hahn-Ring 6, 80200, Munich, Germany aut Strzoda R. Corporate Technology, Siemens AG, Otto-Hahn-Ring 6, 80200, Munich, Germany aut Amann M.-C Walter Schottky Institute, Technical University of Munich, Am Coulombwall 3, 85748, Garching, Germany aut Applied Physics B Springer-Verlag 102/2(2011-02-01), 381-389 0946-2171 102:2<381 2011 102 340 https://doi.org/10.1007/s00340-010-4011-0 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s00340-010-4011-0 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Chen J. Corporate Technology, Siemens AG, Otto-Hahn-Ring 6, 80200, Munich, Germany aut NATIONALLICENCE 700 1- Hangauer A. Corporate Technology, Siemens AG, Otto-Hahn-Ring 6, 80200, Munich, Germany aut NATIONALLICENCE 700 1- Strzoda R. Corporate Technology, Siemens AG, Otto-Hahn-Ring 6, 80200, Munich, Germany aut NATIONALLICENCE 700 1- Amann M.-C Walter Schottky Institute, Technical University of Munich, Am Coulombwall 3, 85748, Garching, Germany aut NATIONALLICENCE 773 0- Applied Physics B Springer-Verlag 102/2(2011-02-01), 381-389 0946-2171 102:2<381 2011 102 340 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer