caa a22 4500 445380675 CHVBK 20180317143016.0 cr unu---uuuuu 170323e20110101xx s 000 0 eng 10.1007/s10948-010-0875-9 doi (NATIONALLICENCE)springer-10.1007/s10948-010-0875-9 Study for AC Loss Reduction in Bi2223 Tapes by Introducing Oxide Barriers [Elektronische Daten] [R. Inada, Y. Okumura, A. Oota, C. Li, P. Zhang] This paper presents our recent activities for the development of low-loss Bi2223 tapes with interfilamentary oxide barriers. In order to suppress the side effect on Bi2223 phase formation during sintering process, SrZrO3 was selected as barrier materials. Moreover, small amount of Bi2212 was mixed with SrZrO3 to improve their ductility for cold working. By controlling coating thickness of oxide barriers before stacking, reducing a tape width below 3mm and careful twisting of the filaments with its length below 5mm, coupling frequency f c exceeded 250Hz even in an AC perpendicular magnetic field. Critical current densities J c of tightly twisted barrier tapes were ranged in 12-14kA/cm2 at 77K and self-field, which was 25% lower than the nontwisted one (=18kA/cm2). To our knowledge, this is the first result to achieve both J c>12kA/cm2 and f c>250Hz simultaneously for Bi2223 tapes in an isolated state. These twisted barrier tapes showed 60-70% lower perpendicular field losses than a conventional 4mm-width tape with fully coupled filaments at 50mT and 50Hz. Springer Science+Business Media, LLC, 2010 Bi2223 tapes nationallicence Oxide barriers nationallicence AC losses nationallicence Coupling frequency nationallicence Inada R. Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology, Tempaku-cho, 441-8580, Toyohashi, Aichi, Japan aut Okumura Y. Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology, Tempaku-cho, 441-8580, Toyohashi, Aichi, Japan aut Oota A. Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology, Tempaku-cho, 441-8580, Toyohashi, Aichi, Japan aut Li C. Northwest Institute for Nonferrous Metal Research, 710016, Xi'an, Shaanxi, P.R. China aut Zhang P. Northwest Institute for Nonferrous Metal Research, 710016, Xi'an, Shaanxi, P.R. China aut Journal of Superconductivity and Novel Magnetism Springer US; http://www.springer-ny.com 24/1-2(2011-01-01), 1027-1032 1557-1939 24:1-2<1027 2011 24 10948 https://doi.org/10.1007/s10948-010-0875-9 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10948-010-0875-9 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Inada R. Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology, Tempaku-cho, 441-8580, Toyohashi, Aichi, Japan aut NATIONALLICENCE 700 1- Okumura Y. Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology, Tempaku-cho, 441-8580, Toyohashi, Aichi, Japan aut NATIONALLICENCE 700 1- Oota A. Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology, Tempaku-cho, 441-8580, Toyohashi, Aichi, Japan aut NATIONALLICENCE 700 1- Li C. Northwest Institute for Nonferrous Metal Research, 710016, Xi'an, Shaanxi, P.R. China aut NATIONALLICENCE 700 1- Zhang P. Northwest Institute for Nonferrous Metal Research, 710016, Xi'an, Shaanxi, P.R. China aut NATIONALLICENCE 773 0- Journal of Superconductivity and Novel Magnetism Springer US; http://www.springer-ny.com 24/1-2(2011-01-01), 1027-1032 1557-1939 24:1-2<1027 2011 24 10948 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer