caa a22 4500 445820454 CHVBK 20180317145242.0 cr unu---uuuuu 170323e20111201xx s 000 0 eng 10.1007/s10825-011-0371-x doi (NATIONALLICENCE)springer-10.1007/s10825-011-0371-x Crosstalk overshoot/undershoot analysis and its impact on gate oxide reliability in multi-wall carbon nanotube interconnects [Elektronische Daten] [Debaprasad Das, Hafizur Rahaman] The work in this paper analyzes the crosstalk effects in Multi-wall Carbon Nanotube (MWCNT) based interconnect systems, and its impact on the reliability of the gate oxide of MOS devices. The electrical circuit parameters for interconnect are calculated using the existing models of MWCNT and the equivalent circuit has been developed to perform the crosstalk analysis. The crosstalk induced overshoot/undershoots have been estimated and the effect of the overshoot/undershoots on the gate oxide reliability is calculated in terms of failure-in-time (FIT) rate of the MOS devices. Single, double, and bundle of MWCNTs are considered for the analysis. The results are compared with that of traditional Cu based interconnects. It has been found that the average failure rate due to crosstalk overshoot/undershoots is ∼10 to 100 times less in MWCNT based interconnect of length between 10 µm to 50 µm as compared to the copper based interconnects. Our analysis shows the applicability of MWCNTs in future VLSI circuits from the perspective of gate oxide reliability. The results also reveal that single or double MWCNT of large diameter is better than bundle of MWCNTs of smaller diameter. Springer Science+Business Media LLC, 2011 Carbon Nanotube (CNT) nationallicence Single-Wall CNT (SWCNT) nationallicence Multi-Wall CNT (MWCNT) nationallicence Crosstalk nationallicence Gate Oxide Reliability nationallicence Average Failure Rate (AFR) nationallicence Das Debaprasad School of VLSI Technology, Bengal Engineering and Science University, Shibpur, 711102, Howrah, India aut Rahaman Hafizur School of VLSI Technology, Bengal Engineering and Science University, Shibpur, 711102, Howrah, India aut Journal of Computational Electronics Springer US; http://www.springer-ny.com 10/4(2011-12-01), 360-372 1569-8025 10:4<360 2011 10 10825 https://doi.org/10.1007/s10825-011-0371-x text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10825-011-0371-x text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Das Debaprasad School of VLSI Technology, Bengal Engineering and Science University, Shibpur, 711102, Howrah, India aut NATIONALLICENCE 700 1- Rahaman Hafizur School of VLSI Technology, Bengal Engineering and Science University, Shibpur, 711102, Howrah, India aut NATIONALLICENCE 773 0- Journal of Computational Electronics Springer US; http://www.springer-ny.com 10/4(2011-12-01), 360-372 1569-8025 10:4<360 2011 10 10825 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer